研究目的
Investigating the changes in the microstructure of WE43 induced by LPBF in comparison to that of cast WE43.
研究成果
The study provides detailed insights into the microstructure of LPBF-fabricated WE43, identifying different microstructural zones and intermetallic phases. It highlights the potential of LPBF-processed WE43 for application as porous scaffold material for bone regeneration after further understanding of the microstructural features generated by additive manufacturing.
研究不足
The study focuses on the microstructure analysis of LPBF-processed WE43 and its comparison with cast WE43. The influence of LPBF process parameters on the microstructure and properties is not extensively explored.
1:Experimental Design and Method Selection
The study employed electron microscopy imaging, and chemical mapping based on energy-dispersive X-ray spectroscopy in conjunction with electron diffraction for the identification of the various phases.
2:Sample Selection and Data Sources
LPBF samples were made from Mg-alloy powder MAP+43? provided by Magnesium Elektron?. Cast material of the same nominal composition was used as a reference.
3:List of Experimental Equipment and Materials
A laboratory LPBF device consisting of a single-mode ytterbium fiber laser and a process chamber, based on AconityMINI system technology, was employed. SEM (Hitachi SU-70 SEM with a field-emission gun and Oxford Instruments EDS detector), TEM (FEI Talos F200X operated at 200 kV), and XRD were used for analysis.
4:Experimental Procedures and Operational Workflow
LPBF was performed at a laser power of 200 W, with a beam diameter of approximately 125 μm, a scan speed of 700 mm s-1, a hatch spacing of 40 μm, and a layer thickness of 30 μm. The scanning was performed according to a bidirectional scan pattern rotated by 90° at each new layer.
5:Data Analysis Methods
EDS analysis was performed using FEI’s Super-X? detector. Chemical maps were acquired in 10 to 60 minutes and data were interpreted with Brucker’s Esprit software using the Cliff-Lorimer scheme. Crystallographic analyzes were carried out using selected-area electron diffraction (SAED) and nanodiffraction (ND).
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Zeiss NVision 40 FIB-SEM
NVision 40
Zeiss
Focused ion beam preparation of TEM samples
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Hitachi SU-70 SEM
SU-70
Hitachi
Scanning electron microscopy imaging
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FEI Talos F200X
Talos F200X
FEI
Transmission electron microscopy investigations
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MAP+43?
Magnesium Elektron?
Base material for LPBF samples
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AconityMINI
LPBF device
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GATAN PIPS II
PIPS II
GATAN
Precise ion polishing system for TEM sample preparation
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