研究目的
Investigating the effects of molybdenum incorporation on the performance of Cu1.69ZnSnS4 (CZTS) kesterite photovoltaic devices, focusing on microstructure, optical-electronic properties, and device efficiency.
研究成果
Mo incorporation into CZTS by co-sputtering enhances photovoltaic performance through improved microstructure, reduced resistivity, increased carrier concentration, and reduced band tailing. The optimized device achieved a PCE of 5.49%, demonstrating the potential of Mo incorporation for improving kesterite solar cell efficiency.
研究不足
The study is limited by the technical constraints of co-sputtering and sulfurization processes, potential for secondary phase formation, and the need for optimization of Mo incorporation levels to maximize device performance without adversely affecting crystallinity.
1:Experimental Design and Method Selection:
Co-sputtering of Mo and non-stoichiometric quaternary compound targets to deposit Mo-incorporated CZTS absorber layers. Sulfurization at 600 °C to confirm Mo incorporation into CZTS.
2:Sample Selection and Data Sources:
Mo-coated soda lime glass (SLG) substrates were used. Elemental composition and distribution were analyzed using X-ray diffraction (XRD), secondary ion mass spectrometry (SIMS), and energy dispersive spectroscopy (EDS).
3:List of Experimental Equipment and Materials:
Denton Discovery 18 magnetron sputtering system, Bruker D8 XRD system, TOF-SIMS 4 time-of-flight secondary ion mass spectrometry system, VG ESCALAB 220i-XL X-ray photoelectron spectroscopy system, JEOL JSM7600F field emission scanning electron microscope (FESEM), JEOL JEM-2100F scanning transmission electron microscope (STEM), UV-3600 Shimadzu UV–VIS-NIR spectrophotometer, MicroXact A4P-200 four point probe system.
4:Experimental Procedures and Operational Workflow:
Cleaning of SLG substrates, Mo sputter deposition, co-sputtering of Mo and CZTS, sulfurization, CdS film growth by chemical bath deposition (CBD), ITO film deposition, thermal annealing, device definition, and top contact preparation.
5:Data Analysis Methods:
Structural and crystallinity analysis by XRD, elemental depth profiling by SIMS, surface characterization by XPS, cross-section imaging by FESEM and STEM, absorbance spectra measurement, sheet resistance measurement, and photovoltaic performance evaluation.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Bruker D8 XRD system
D8
Bruker
Used for structural properties and crystallinity analysis of Mo-incorporated CZTS films.
-
JEOL JSM7600F field emission scanning electron microscope
JSM7600F
JEOL
Used for cross-section electron microscopy images.
-
JEOL JEM-2100F scanning transmission electron microscope
JEM-2100F
JEOL
Used for high resolution cross-sectional images of the solar cells.
-
UV-3600 Shimadzu UV–VIS-NIR spectrophotometer
UV-3600
Shimadzu
Used for absorbance spectra measurement.
-
Denton Discovery 18 magnetron sputtering system
Discovery 18
Denton
Used for the deposition of Mo thin films and co-sputtering of Mo and CZTS targets.
-
TOF-SIMS 4 time-of-flight secondary ion mass spectrometry system
TOF-SIMS 4
Used for elemental depth profiling of CZTS/CdS solar cells.
-
VG ESCALAB 220i-XL X-ray photoelectron spectroscopy system
ESCALAB 220i-XL
VG
Used for surface characterization of CZTS film samples.
-
MicroXact A4P-200 four point probe system
A4P-200
MicroXact
Used for sheet resistance measurement.
-
登录查看剩余6件设备及参数对照表
查看全部