研究目的
To understand how to make bulk titanium parts or coatings with desired levels of titanium nitrides by investigating the dynamic interactions between titanium and nitrogen under representative laser-based additive manufacturing (AM) conditions.
研究成果
The study successfully identifies the high temperature reaction steps between Ti and N2 under laser-based AM conditions, revealing phase transformations and the influence of N2 content on nitride formation. It demonstrates the potential for controlling nitride levels in titanium parts or coatings through laser AM processes.
研究不足
The study focuses on the early stage of nitride formation under laser AM conditions, with limited exploration of mechanical properties for samples prepared under different N2 content.
1：Experimental Design and Method Selection:
The study investigates the dynamic interactions between titanium and nitrogen under laser-based AM conditions, using in-situ synchrotron X-ray diffraction (SXRD) to reveal high temperature reaction steps.
2：Sample Selection and Data Sources:
Commercially pure Ti pieces are used as targets under different N2 environments.
3：List of Experimental Equipment and Materials:
An IPG YLS-2000 fiber laser, Protein Crystallography synchrotron beamline, PILATUS 100 K detector system, and custom SLM device are used.
4：Experimental Procedures and Operational Workflow:
Laser irradiation is applied under controlled N2 atmospheres, with in-situ SXRD tests performed to monitor phase transformations.
5：Data Analysis Methods:
FIT2D software is used for data integration and analysis to determine diffraction angles and intensities.
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IPG YLS-2000 fiber laser
YLS-2000
IPG
Heating source to mimic the LENS process
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Kratos AXIS 165 X-ray photoelectron spectroscopy
AXIS 165
Kratos
Test surface compositions
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PILATUS 100 K detector system
100 K
Dectris AG
Logging the diffraction data
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ProSeries II scan head
II
Control the scan patterns
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JENar F-Theta lens
F-Theta
Reduce the laser spot size
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Quanta 3D DualBeam FEG FIB-SEM scanning electron microscope
3D DualBeam FEG FIB-SEM
Quanta
Observe the microstructures of the laser processed areas
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PANalytical X-ray diffraction
PANalytical
Analyze phases of laser scanned surfaces
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