研究目的
Investigating the structural and electronic properties of semiconductor materials using advanced electron microscopy techniques.
研究成果
The research demonstrates the effectiveness of electron holography and microscopy in analyzing semiconductor materials. It provides insights into the structural and electronic properties, suggesting potential applications in optoelectronics. Future studies should focus on improving resolution and exploring new materials.
研究不足
The study is limited by the resolution of electron microscopy techniques and the complexity of sample preparation. Future work could explore higher resolution methods and more diverse semiconductor materials.
