研究目的
Investigating the influence of planar material size and position on shielding effectiveness measurements using the dual waveguide method.
研究成果
The dual waveguide method is effective for measuring the shielding effectiveness of planar materials, with sample size and position being critical factors. Optimal results are achieved when conductive materials match the waveguide's surface size at the calibration plane. The study also concludes that the placement of the material at either port of the dual waveguide and the waveguide length do not significantly affect the shielding effectiveness measurement results.
研究不足
The study is limited to planar materials and specific frequency ranges (L-band and X-band). The practicality of using large waveguides for certain applications is also a constraint.
1：Experimental Design and Method Selection:
The study uses the dual waveguide method for shielding effectiveness measurements, focusing on the effect of sample size and position.
2：Sample Selection and Data Sources:
Different sizes and shapes of planar materials (e.g., aluminum foil, copper tape, Bremen-RS) are tested.
3：List of Experimental Equipment and Materials:
Includes a Vector Network Analyzer (Rohde & Schwarz ZVB20), L-band and X-band waveguides, and various planar materials.
4：Experimental Procedures and Operational Workflow:
Materials are placed in different positions and sizes within the waveguide, and their shielding effectiveness is measured.
5：Data Analysis Methods:
The shielding effectiveness is calculated using S-parameters, with results analyzed for consistency and reliability.
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