研究目的
Investigating the effect of Mg doping on CuCrO2 nanoparticles and their performance as hole transport layers in organic and perovskite solar cells.
研究成果
Mg doping in CCO nanoparticles increases work function and decreases particle size, leading to improved performance as HTLs in OSCs and PSCs. The study provides new insights into the role of Mg:CCO HTLs in enhancing the performance of a wide range of solar cells.
研究不足
The variation among different diodes is large for all parameters, and the improvement in PCE is not clearly discernible due to different trends in other parameters and sample variation. The effects of Mg doping on PL intensity and lifetimes are not discernable, possibly due to confounding factors such as surface recombination.
1：Experimental Design and Method Selection:
Hydrothermal synthesis of CCO and Mg:CCO nanoparticles. Characterization using XRD, EDX, TEM, DLS, XPS, SEM, UV-vis absorption spectrometry, PESA, and KP techniques.
2：Sample Selection and Data Sources:
CCO and Mg:CCO nanoparticles synthesized with 0 at%, 5 at%, and 10 at% Mg doping levels.
3：List of Experimental Equipment and Materials:
Rigaku Ultima III diffractometer, Zeiss Supra 40 SEM, Delong LVEM5 Benchtop Electron Microscope, Malvern Zetasizer Nano ZS instrument, PHI 5000 Versa Probe II XPS, Ocean Optics USB 4000 UV-vis spectrometer, J. A. Woollam M-2000DI spectroscopic ellipsometer, RKI Instruments Model AC-2 PESA, KP Technology SKP 5050 KP apparatus.
4：Experimental Procedures and Operational Workflow:
Synthesis of nanoparticles, preparation of suspensions and films, characterization of structural, chemical, morphological, optical, and electronic properties, fabrication and testing of solar cells.
5：Data Analysis Methods:
Rietveld refinement of XRD patterns, Gaussian–Lorentzian profile fitting of XPS spectra, Tauc plots for band gap determination, statistical analysis of device performance parameters.
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Ocean Optics USB 4000 UV-vis spectrometer
USB 4000
Ocean Optics
Characterization of optical transmission of the films.
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J. A. Woollam M-2000DI spectroscopic ellipsometer
M-2000DI
J. A. Woollam
Measurement of film thickness.
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Rigaku Ultima III diffractometer
Ultima III
Rigaku
Characterization of crystalline phases of nanoparticles.
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Zeiss Supra 40 SEM
Supra 40
Zeiss
Examination of film morphologies and elemental composition.
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Malvern Zetasizer Nano ZS instrument
Zetasizer Nano ZS
Malvern
Measurement of hydrodynamic sizes by DLS.
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Delong LVEM5 Benchtop Electron Microscope
LVEM5
Delong TEM
Measurement of nanoparticle size from TEM images.
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PHI 5000 Versa Probe II XPS
Versa Probe II
PHI
Analysis of elemental compositions and chemical states of the films.
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RKI Instruments Model AC-2 PESA
AC-2
RKI Instruments
Measurement of ionization energy.
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KP Technology SKP 5050 KP apparatus
SKP 5050
KP Technology
Measurement of work function.
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