研究目的
Investigating the effects of spontaneous polarization and local structural disorder on the broad luminescent spectrum of Nd-doped Pb(Mg1/3Nb2/3)O3-PbTiO3 ferroelectric crystals.
研究成果
The study demonstrates that Nd-doped PMNT complex ferroelectric crystals exhibit a broad emission spectrum due to spontaneous polarization and local structural disorder. These crystals have potential applications in femtosecond lasers and multifunctional materials combining laser and piezoelectric applications.
研究不足
The study is limited to Nd-doped PMNT single crystals and their specific properties. The potential for optimization in piezoelectric coefficients and the exploration of other complex ferroelectric crystals are areas for future research.
1：Experimental Design and Method Selection:
The study focused on the growth of Nd-doped PMNT single crystals using the top-seeded solution-growth method and analyzed their photoluminescence, dielectric, and ferroelectric properties.
2：Sample Selection and Data Sources:
Nd-doped PMNT single crystals were grown and characterized for their chemical composition, phase structure, and optical properties.
3：List of Experimental Equipment and Materials:
Instruments used include inductively coupled plasma emission spectrometry (ICP-OES), X-ray powder diffraction, PerkinElmer Lambda950 for absorption spectrum measurement, Edinburgh Instruments FLS980 UV/V/NIR ?uorescence spectrometer for photoluminescence measurements, Novocontrol GmbH broadband dielectric/impedance spectrometer for dielectric measurements, and aix-ACCT TF2000 ferroelectric analyzer for P?E hysteresis loops.
4：Experimental Procedures and Operational Workflow:
The crystals were grown, polished, and coated for measurements. Absorption, photoluminescence, dielectric, and ferroelectric properties were measured at various temperatures.
5：Data Analysis Methods:
The absorption cross section and emission cross section were calculated using specific formulas, and the fluorescence decay curves were fitted by a single exponential function.
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X-ray powder diffraction
MiniFlex600
Rigaku
Phase structure determination
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UV/V/NIR ?uorescence spectrometer
FLS980
Edinburgh Instruments
Photoluminescence measurements
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ICP-OES
Ultima 2
HORIBA Jobin Yvon
Chemical composition analysis
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Broadband dielectric/impedance spectrometer
Novocontrol GmbH
Dielectric measurements
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Ferroelectric analyzer
TF2000
aix-ACCT
Polarization?electric field (P?E) hysteresis loops measurement
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