研究目的
To enhance the electron mobility of SnO2-based electron transport layers (ETLs) in planar perovskite solar cells (PSCs) by doping with red-carbon quantum dots (RCQs) for improved efficiency and stability.
研究成果
The doping of SnO2 with RCQs significantly enhances the electron mobility of the ETL, leading to improved efficiency and stability of planar PSCs. The novel SnO2-RCQs ETL promotes the formation of highly crystallized perovskite films with enhanced phase purity and uniformity, contributing to the outstanding performance of the PSCs.
研究不足
The study focuses on the enhancement of electron mobility and stability of PSCs using RCQs-doped SnO2 ETLs. Limitations include the specific conditions under which the PSCs were tested (e.g., humidity levels, temperature) and the scalability of the synthesis and fabrication processes for industrial applications.
1:Experimental Design and Method Selection:
The study involved doping SnO2 with RCQs to enhance its electron mobility. The methodology included the synthesis of RCQs, preparation of SnO2-RCQs composite, and fabrication of PSCs.
2:Sample Selection and Data Sources:
Perovskite films were deposited on SnO2 and SnO2-RCQs ETLs. Data were collected using various characterization techniques.
3:List of Experimental Equipment and Materials:
Instruments included a UV–ozone chamber, spin coater, hot plate, vacuum chamber, and various spectrometers for characterization. Materials included ITO glasses, SnO2 solution, perovskite precursors, and RCQs.
4:Experimental Procedures and Operational Workflow:
The process involved cleaning ITO substrates, spin-coating SnO2 or SnO2-RCQs, depositing perovskite layers, and finally depositing electrodes.
5:Data Analysis Methods:
Data were analyzed using techniques like GIXRD, XPS, AFM, SEM, PL, TRPL, and J–V measurements to assess the performance and properties of the ETLs and PSCs.
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Ultraviolet spectrophotometer
UV-1750
SHIMADZU
Measuring optical absorption, transmission, and reflection spectra
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Fluorescence spectrophotometer
F-4600
Hitachi
Measuring photoluminescence spectra
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FLS980 spectrometer
FLS980
Edinburgh Instruments
Collecting time-resolved PL spectra
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Atomic force microscope
5500
Keysight
Imaging surface topographies
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Semiconductor characterization system
4200-SCS
Keithley
Current measurement
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UV–ozone chamber
Cleaning and treating ITO substrates
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Spin coater
Depositing SnO2 and SnO2-RCQs layers
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Hot plate
Annealing deposited films
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Vacuum chamber
Depositing MoO3 and Au electrodes
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Series 2400 Source Measure Unit (SMU) Instrument
2400
Keithley Instruments
Testing photovoltaic device performances
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AM 1.5-G solar simulator
Enlitech
Simulating solar conditions for testing
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QE-R
Enlitech
Evaluating EQE measurements
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GIXRD measurement system
BL14B1 beamline
Shanghai Synchrotron Radiation Facility (SSRF)
Measuring film crystallization
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X-ray photoelectron spectroscopy system
Analyzing chemical interactions in films
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Laser scanning confocal microscope
JadeMAT
SouthPort
Measuring TRPL mapping
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Lakeshore probe station
Lakeshore
Measuring activation energy of ion migration
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