研究目的
Investigating the enhancement of silver nanowire (AgNW)-based transparent conducing films (TCFs) performance by introducing aluminosilicate nanotubes (AlSiNTs) which can reduce silver ions to form silver nanoparticles (AgNPs) under ambient conditions.
研究成果
The study concludes that AlSiNTs can reduce silver ions to form AgNPs under ambient conditions without additional reducing agents, improving the performance of AgNW-based TCFs. The novel TCFs proposed outperform most existing metal oxides- or AgNW-based conducting films in terms of transparency and conductivity.
研究不足
The study notes that the high concentration of AgNO3 used might facilitate the decomposition of AlSiNTs, and the computational calculations were carried out assuming the systems in a gaseous phase instead of an aqueous phase.
1:Experimental Design and Method Selection:
The study involved mixing a suspension of AlSiNTs with silver nitrate to form AgNPs under ambient conditions without additional reducing agents.
2:Sample Selection and Data Sources:
As-synthesized AlSiNTs and zeolite FAU were used as samples.
3:List of Experimental Equipment and Materials:
TEM, SEM, OM, XRD, UV-vis spectroscopy, XPS, and four-point resistivity measurement were used for characterization.
4:Experimental Procedures and Operational Workflow:
The process included synthesis of AlSiNTs and zeolite FAU, deposition of AlSiNT-AgNO3-3d and FAU-AgNO3-3d on glass substrate, and fabrication of transparent conductive films.
5:Data Analysis Methods:
DFT calculations were used to understand the reducing capability of AlSiNTs.
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Hitachi H-7100 transmission electron microscope
H-7100
Hitachi
TEM images collection
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Agilent Cary 300 ultraviolet-visible spectrophotometer
Cary 300
Agilent
UV-vis absorbance spectra collection
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Rigaku diffractometer
Ultima IV
Rigaku
XRD analysis
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Thermo Scientific Theta Probe
Theta Probe
Thermo Scientific
XPS spectra recording
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Hitachi S-4800 field emission scanning electron microscope
S-4800
Hitachi
imaging thin-film and transparent-electrode samples
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Bruker Avance III spectrometer
Avance III
Bruker
solid-state NMR spectra collection
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Whited WM-100 optical microscope
WM-100
Whited
surface characterization of thin-film samples
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KeithLink four-point probe station
LRS4-TG
KeithLink
determining sheet resistance of thin-film samples
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