研究目的
Investigating TM-polarized subwavelength grating waveguides in silicon-on-insulator with air top-cladding for mid-infrared applications to enhance detection sensitivity through increased electrical field overlap.
研究成果
The study successfully demonstrates the first TM-polarized subwavelength grating waveguides in silicon-on-insulator with air top-cladding for mid-infrared applications, achieving a high electrical field overlap of ~38% with negligible propagation loss. This advancement has the potential to significantly improve the sensitivity of absorption-spectroscopy-based sensors.
研究不足
The study is based on simulations, and practical implementation may face challenges such as fabrication tolerances and material imperfections. The actual performance in sensing applications needs experimental validation.
1：Experimental Design and Method Selection:
The study employs 3D FDTD simulations to optimize the waveguide parameters for maximum electrical field overlap and minimal propagation loss.
2：Sample Selection and Data Sources:
The study focuses on silicon-on-insulator (SOI) substrates targeting the mid-infrared wavelength range from
3：35μm to 45μm. List of Experimental Equipment and Materials:
The primary material is silicon-on-insulator, with air as the top-cladding.
4：Experimental Procedures and Operational Workflow:
Parameters such as waveguide height, width, period, and duty cycle are scanned to optimize the mode overlapping factor.
5：Data Analysis Methods:
The analysis involves comparing the electrical field overlap between TE and TM polarized light to determine the optimal configuration for sensing applications.
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