研究目的
To improve the quality of the calibrated image taken by a low-cost conventional electroluminescent (EL) imaging setup, proposing a novel methodology to enhance the speed of the detection of the solar cell cracks, and develop a proper procedure to decide whether to accept or reject the solar cell due to the existence of the cracks.
研究成果
The proposed technique uses an ORing method that is capable of digitally enhancing the output images of the conventional EL imaging technique. The crack detection system has been shown to be beneficial with the rapid real-time data acquisition necessitated by cell layout and tabbing phases in the PV wafer manufacturing process.
研究不足
A reference sample is required in order to run the system. Mathematical calculations have to be included in the detection system to identify the position and size of the actual cracks.
1：Experimental Design and Method Selection:
The study uses an ORing method to digitally compare between the examined/cracked and a healthy/non-cracked solar cell samples. An accept/reject criterion is introduced using the concept of the plot profile of the gray level for the examined solar cell samples.
2：Sample Selection and Data Sources:
Various cracked/free-crack solar cell samples were used for validation.
3：List of Experimental Equipment and Materials:
A low-cost conventional electroluminescent (EL) imaging setup, including a digital camera equipped with a typical 18–55 mm lens and a SensoCam CCD camera.
4：Experimental Procedures and Operational Workflow:
The EL image of the solar cell is captured and processed using the ORing method to detect cracks. The output image is then analyzed using a plot profile to determine the gray level drop, indicating the presence of cracks.
5：Data Analysis Methods:
The position and size of the cracks are determined using mathematical calculations based on the binary image processing.
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