研究目的
Investigating the formation and propagation mechanisms of reverse bias induced wormlike defects in Cu(In,Ga)Se2 (CIGS) solar cells to mitigate their negative effects or prevent their formation.
研究成果
A propagation mechanism for wormlike defects in CIGS solar cells was proposed, based on compositional changes observed near the defects. The mechanism involves a chemical reaction fueled by heat and electric current, leading to the replacement of indium, gallium, and copper by cadmium, and selenium by sulfur. This study opens avenues for further research into the reaction mechanism and the role of the electric field in defect propagation.
研究不足
The exact mechanism of the reaction inside the hotspot and the role of the electric field in the propagation of the wormlike defects are not fully understood and require further investigation.
1：Experimental Design and Method Selection:
Nonencapsulated small CIGS solar cells were exposed to reverse bias conditions to simulate partial shading in a module, leading to the formation of wormlike defects. Scanning electron microscopy-energy-dispersive X-ray spectroscopy (SEM-EDX) and spectrally resolved photoluminescence (sr-PL) were used to analyze the defects.
2：Sample Selection and Data Sources:
Ten nonencapsulated small cells with an active area of approximately 5 mm × 7 mm were used, designed to mimic the geometry in a monolithically interconnected module.
3：List of Experimental Equipment and Materials:
A Keithley 2400 source measure unit for reverse bias treatment, JEOL JSM-6010LA IntouchScope for SEM-EDX, Horiba Labram Aramis Raman microscope for sr-PL, and a Greateyes LumiSolarCell LED-based EL/PL system for PL measurements.
4：Experimental Procedures and Operational Workflow:
Reverse bias treatment was performed by sweeping a voltage in the dark from +0.7 till ?10.0 V. After defect formation, samples were etched to allow for SEM-EDX and sr-PL measurements.
5：7 till ?0 V. After defect formation, samples were etched to allow for SEM-EDX and sr-PL measurements.
Data Analysis Methods:
5. Data Analysis Methods: EDX point analyses were averaged from eight measurements. PL spectra were normalized and analyzed for additional features indicating electronic-defect levels.
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