研究目的
To improve the efficacy of the spatial confinement of excitons for higher luminescence efficiency in CsPbBr3-based light-emitting diodes (LEDs) by controlling the growth kinetics of vacuum-deposited CsPbBr3 films.
研究成果
The study demonstrated that controlling the growth kinetics of vacuum-deposited CsPbBr3 films by adjusting the deposition flux can significantly improve the efficiency of perovskite LEDs. The optimal deposition rate of 0.9 ?/s resulted in films with nanoscale grain structure and high luminescence efficiency, leading to LEDs with a maximum current efficiency of 1.07 cd/A and a narrow electroluminescence spectrum.
研究不足
The study acknowledges the need for further optimization in carrier injection efficiency and defect passivation to improve device performance. The PLQY of CsPbBr3 film was low (~1%), indicating potential areas for improvement.
1:Experimental Design and Method Selection:
The study involved the thermal co-evaporation of CsBr and PbBr2 to form CsPbBr3 thin films, with the growth kinetics controlled by adjusting the deposition flux.
2:Sample Selection and Data Sources:
Glass substrates with a patterned indium-doped tin oxide (ITO) coating were used.
3:List of Experimental Equipment and Materials:
Equipment included a quartz crystal microbalance (QCM) sensor for monitoring deposition rates, SEM and AFM for morphology analysis, XRD for crystallographic analysis, and various spectrometers for optical characterization.
4:Experimental Procedures and Operational Workflow:
The process involved cleaning and preparing ITO substrates, depositing CsPbBr3 films at different rates, and characterizing the films and devices.
5:Data Analysis Methods:
Data analysis included fitting TRPL decay curves with a bi-exponential model and analyzing temperature-dependent PL to determine exciton binding energies.
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scanning electron microscope
Hitachi S4800
Hitachi
Collecting plan-view and cross-sectional images of the films
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X-ray photoelectron spectroscopy equipment
Thermo VG scientific Sigma Probe
Thermo VG
Conducting XPS and UPS
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source meter
Keithley 2400
Keithley
Measuring current density-voltage-luminance characteristics and EL spectra
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quartz crystal microbalance
QCM
Monitoring the deposition rate of the sources
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atomic force microscope
XE-100
Park Systems
Collecting AFM images of the films
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spectrophotofluorometer
Fluorolog3
Measuring steady-state photoluminescence and time-resolved photoluminescence decay curves
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UV-VIS-NIR spectrophotometer
Solid Spec-3700
Measuring absorption spectra
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luminance colorimeter
BM-7A
Measuring current density-voltage-luminance characteristics
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spectroradiometer
CS-2000
Measuring EL spectra
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