研究目的
To extend the discrete mode matching (DMM) method to analyze multilayered microwave structures with inhomogeneous dielectric layers, including those with lossy and/or anisotropic materials.
研究成果
The extended DMM method effectively analyzes multilayered planar structures with inhomogeneous dielectric layers, including those with electric and magnetic anisotropy. The method's validation against open literature shows good agreement, demonstrating its applicability to various waveguide structures.
研究不足
The paper does not explicitly mention limitations, but the method's accuracy and computational efficiency may depend on the discretization scheme and the complexity of the material properties.
1：Experimental Design and Method Selection:
The DMM method is employed for the analysis, utilizing exact eigen-values dependent on lateral boundary conditions and reducing computational effort by avoiding unnecessary approximations.
2：Sample Selection and Data Sources:
Various waveguide structures with inhomogeneous dielectric layers are analyzed.
3：List of Experimental Equipment and Materials:
The method involves mathematical formulation and computational analysis without specific physical equipment.
4：Experimental Procedures and Operational Workflow:
The procedure involves deriving the dyadic Green's function using a full-wave equivalent circuit in the spectral domain and applying boundary conditions to solve for propagation constants.
5：Data Analysis Methods:
The propagation constants are computed by solving an indirect eigenvalue problem derived from the system equation.
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