研究目的
To develop an efficient all-solution-processed perovskite light-emitting diode (PeLED) by incorporating a small-molecule doped electron injection layer to enhance electron injection and suppress emission quenching.
研究成果
The incorporation of TPBi-doped PFN as an electron injection layer significantly enhances the performance of all-solution-processed PeLEDs, achieving high luminance and efficiency. This approach offers a promising pathway for the commercialization of PeLEDs.
研究不足
The study focuses on green PeLEDs, and the approach may need adaptation for other colors. The performance of all-solution-processed PeLEDs still lags behind those with vacuum-deposited CTLs.
1:Experimental Design and Method Selection:
The study involved the design of all-solution-processed PeLEDs with a TPBi-doped PFN electron injection layer. The methodology included the use of orthogonal solvents for perovskite precursors and PFN to protect the perovskite film during the solution process.
2:Sample Selection and Data Sources:
The perovskite layer was deposited from a precursor solution by mixing PEO:CsPbBr3 in DMSO, followed by thermal annealing. The TPBi-doped PFN solution was prepared by adding different weight ratios of TPBi to PFN in chlorobenzene.
3:List of Experimental Equipment and Materials:
Materials included CsBr, PbBr2, DMSO, PEO, PEDOT:PSS, PFN, TPBi, and chlorobenzene. Equipment used for characterization included AFM, SEM, UPS, UV–vis–NIR spectrometer, Hall Measurement System, PL spectrometer, and Keithley 2400 source.
4:Experimental Procedures and Operational Workflow:
The PeLEDs were fabricated by spin-coating PEDOT:PSS onto ITO substrates, followed by the perovskite layer and the TPBi-doped PFN layer. Al cathode was deposited by thermal evaporation.
5:Data Analysis Methods:
The performance of PeLEDs was evaluated through current density–luminance–voltage (J–L–V) characteristics, electroluminescence (EL) spectra, and time-resolved photoluminescence (TRPL) decay measurements.
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PerkinElmer Lambda 950 UV–vis–NIR spectrometer
Lambda 950
PerkinElmer
Absorption spectra measurement
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Edinburgh FLS920 PL spectrometer
FLS920
Edinburgh
Photoluminescence spectra and time-resolved photoluminescence decay spectra measurement
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Keithley 2400 source
2400
Keithley
Current density–luminance–voltage characteristics collection
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SPI3800N AFM instrument
SPI3800N
Seiko Instrument
Atomic force microscopy measurement
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TESCAN MIRA 3 GMU microscopy
MIRA 3 GMU
TESCAN
Scanning electron microscopic measurement
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ESCALAB 250Xi
250Xi
ESCALAB
Ultraviolet photoelectron spectroscopy
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H50 MMR Hall Measurement System
H50
MMR
Mobility measurement
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PR-670 Spectra Scan Spectroradiometer
PR-670
Spectra Scan
EL spectra measurement
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ZJZCL-1 OLED ageing lifespan test instrument
ZJZCL-1
Operating lifetime testing
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