研究目的
Investigating the effects of CAPSO doping on PEDOT:PSS for efficiency enhancement in inverted perovskite solar cells.
研究成果
CAPSO doping significantly enhances the conductivity of PEDOT:PSS and improves the efficiency of PSCs by optimizing the HTL/perovskite interface, leading to a ~38% increase in PCE. The modified HTL shows promise for high-performance PSCs.
研究不足
The study focuses on the enhancement of PEDOT:PSS conductivity and its application in PSCs, but the long-term stability and scalability of the modified HTL in large-area devices are not extensively explored.
1:Experimental Design and Method Selection:
The study involved doping PEDOT:PSS with CAPSO to enhance its conductivity and applying it as HTL in PSCs.
2:Sample Selection and Data Sources:
ITO glass substrates, PEDOT:PSS, CAPSO, and perovskite materials were used.
3:List of Experimental Equipment and Materials:
Four-point probe technique for conductivity, AFM for surface morphology, SEM for film morphology, XRD for crystallinity, UV-vis for absorption spectra, SKPM for work function measurement.
4:Experimental Procedures and Operational Workflow:
Fabrication of PSC devices involved spin-coating PEDOT:PSS@CAPSO on ITO, followed by perovskite layer deposition, PCBM layer, and Ag electrode.
5:Data Analysis Methods:
Conductivity, transmittance, surface roughness, crystallinity, and device performance were analyzed.
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AFM
Dimension Icon
Bruker
Surface morphology analysis
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SEM
S-4800
Hitachi
Film morphology observation
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X-ray Photoelectron Spectrometer
K-Alpha+
Thermo Scientific
Chemical composition analysis
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UV-Vis-NIR spectrophotometer
Lambda 750
PerkinElmer
Absorption and transmittance spectra measurement
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PEDOT:PSS
Clevios P Al4083
Polymer Light Technology Inc.
Hole transport layer in perovskite solar cells
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CAPSO
TCI Shanghai Co., Ltd.
Dopant for PEDOT:PSS to enhance conductivity
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ITO glass substrate
Luoyang Glass Company Limited
Transparent conducting oxide substrate
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PC61BM
Polymer Light Technology Inc.
Electron transport layer in perovskite solar cells
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Four-point probe
HMS-5500
Ecopia
Conductivity measurement
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Contact angle goniometer
CAM 200
KSV
Surface wettability measurement
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