研究目的
Demonstrating localized chemical vapor deposition of WO3-x on a suspended glassy carbon wire for applications in catalysis and gas sensing.
研究成果
The study successfully demonstrates a novel method for localized chemical vapor deposition of WO3-x on suspended glassy carbon wires, offering a scalable platform for creating carbon-TMO structures with applications in catalysis and gas sensing. The method allows for precise control over coating thickness and length through current adjustment.
研究不足
The diameter of the deposited fiber cannot be accurately predetermined, and the process requires precise control of current and temperature to achieve desired coating thickness and uniformity.
1:Experimental Design and Method Selection:
The process involves photopatterning an SU-8 scaffold, near-field electrospinning of an SU-8 fiber, and their pyrolysis to create a monolithic carbon structure. The temperature for deposition is generated by Joule heating.
2:Sample Selection and Data Sources:
Samples are prepared by lithographically patterning SU-8 on a silicon wafer with a thermal oxide layer, followed by near-field electrospinning and pyrolysis.
3:List of Experimental Equipment and Materials:
Includes SU-8 2025 and SU-8 2002 for scaffold and fiber, respectively, a nitrogen atmosphere for carbonization, and a custom glass reactor for LCVD.
4:Experimental Procedures and Operational Workflow:
The carbonization process involves heating ramps and halts under nitrogen. LCVD is performed by passing current through the wire in a reactor with precursor solution.
5:Data Analysis Methods:
The voltage vs current characteristic is measured to monitor the coating evolution. SEM and TEM are used for characterization.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
FEI Quanta 3D SEM/FIB
Quanta 3D
FEI
Focused ion beam for sample preparation
-
Keithley 6221
6221
Keithley
Current source for electrical measurements
-
Keysight 34465A
34465A
Keysight
Multimeter for voltage measurements
-
Lake Shore 330
330
Lake Shore
Temperature controller
-
FEI MAGELLAN 400 XHR
MAGELLAN 400 XHR
FEI
Scanning electron microscope for sample characterization
-
JEOL 2800
2800
JEOL
Transmission electron microscope for sample characterization
-
SU-8 2025
Photopatterning of scaffold
-
SU-8 2002
Near-field electrospinning of fiber
-
InVia Confocal Raman Microscope
InVia
Raman spectroscopy for sample characterization
-
登录查看剩余7件设备及参数对照表
查看全部