研究目的
Reducing photovoltage loss in inverted perovskite solar cells by quantum dots alloying modification at cathode contact.
研究成果
The study concludes that the introduction of a hybrid ligands interfacial layer via QDs alloying reaction significantly reduces VOC loss in inverted PSCs, leading to a VOC of 1.15 V and a PCE of 20.6%. The method also enhances device stability, with PCE maintaining >90% of initial value after 1000 hours of storage.
研究不足
The study acknowledges the technical constraints of the experiments, including the need for precise control over the transfer process of functional ligands from QDs to PVK surface and the potential for introducing new trap states with high concentration ligands solutions.
1:Experimental Design and Method Selection:
The study involved the synthesis of CsPbI3 quantum dots (QDs) and their application as an interfacial layer in inverted planar heterojunction perovskite solar cells (PSCs) to reduce VOC loss. The methodology included the use of heavily washed QDs as a neutral charged intermedia for alloying reaction to transfer ligands without damaging the perovskite.
2:Sample Selection and Data Sources:
The samples included perovskite films before and after QDs modification, with characterization performed using SEM, XRD, UV-vis absorption, PL, TRPL, UPS, and KPFM.
3:List of Experimental Equipment and Materials:
Equipment included a Keithley 2400 source measure unit, AAA class solar simulator (XES-70S1), Enli Technology EQE measurement system (QE-R3011), Agilent E4980A precision LCR meter, and a Bruker FastScan AFM system for KPFM. Materials included CsPbI3 QDs, PTAA, C60, BCP, and Cu.
4:Experimental Procedures and Operational Workflow:
The process involved the synthesis of CsPbI3 QDs, fabrication of PSCs with and without QDs modification, and characterization of the films and devices.
5:Data Analysis Methods:
Data analysis included the evaluation of J-V curves, EQE measurements, and stability tests over 1000 hours.
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Keithley 2400
2400
Keithley
Source measure unit for current density–voltage curve measurement.
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Agilent E4980A
E4980A
Agilent
Precision LCR meter for capacitance variation with frequency or bias measurement.
E4980A/E4980AL Precision LCR Meter
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Bruker FastScan AFM
FastScan
Bruker
AFM system for kelvin probe force microscopy (KPFM) measurements.
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XES-70S1
70S1
san ei electric co.
AAA class solar simulator for light intensity calibration.
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QE-R3011
R3011
Enli Technology
EQE measurement system for external quantum efficiency measurement.
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