研究目的
Investigating the effects of non-conjugated polymers as thickness-insensitive electron transport materials in high-performance inverted organic solar cells.
研究成果
The study concludes that PEIE-DBO, based on bromide ions, is a high-performance, thickness-insensitive ETL for inverted OSCs, showing superior photovoltaic performance compared to PEIE-DCO. The research provides an efficient strategy for designing low-cost and thickness-insensitive polymeric ETLs for future roll-to-roll industry applications.
研究不足
The study focuses on the effects of halide ions on the performance of non-conjugated polymers as ETLs in OSCs. The limitations include the need for further optimization of the polymers for higher conductivity and electron mobility, and the exploration of other halide ions or modifications to improve performance.
1:Experimental Design and Method Selection:
The study involves the preparation of two non-conjugated polymers, PEIE-DBO and PEIE-DCO, by quaternization of polyethyleneimine ethoxylate with 1,8-dibromooctane and 1,8-dichlorooctane, respectively. These polymers are developed as electron transport layers (ETLs) in inverted organic solar cells (OSCs). The effects of halide ions on the photoelectric performance of these polymers are investigated.
2:Sample Selection and Data Sources:
The materials used include PEIE, PTB7-Th, PC71BM, PM6, Y6, and various solvents. The devices are fabricated with configurations such as ITO/ETL/PTB7-Th:PC71BM/MoO3/Al for fullerene-based OSCs and ITO/ETL/PM6:Y6/MoO3/Al for non-fullerene OSCs.
3:List of Experimental Equipment and Materials:
Equipment includes a Keithley 2400 source meter, AM 1.5 Global solar simulator, UV-Vis spectrophotometer, surface profiler, atomic force microscopy, X-ray photoelectron spectroscopy, and ultraviolet photoelectron spectrometer.
4:5 Global solar simulator, UV-Vis spectrophotometer, surface profiler, atomic force microscopy, X-ray photoelectron spectroscopy, and ultraviolet photoelectron spectrometer. Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The ETLs are prepared by spin-coating and annealing. The active layers are deposited by spin-coating from blended solutions. The devices are characterized by measuring current density-voltage (J-V) characteristics, external quantum efficiency (EQE), and other parameters.
5:Data Analysis Methods:
The data are analyzed to determine photovoltaic parameters such as power conversion efficiency (PCE), open-circuit voltage (Voc), short-circuit current density (Jsc), and fill factor (FF). The electron mobilities are determined by fitting the dark current to the space charge-limited currents (SCLC) model.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Keithley 2400 source meter
2400
Keithley
Used for measuring the current density-voltage (J-V) characteristics of the devices.
-
UV-Vis spectrophotometer
Lambda 365
Perkin Elmer
Used for measuring absorption and transmittance spectra.
-
Atomic force microscopy
Innova
Bruker
Used for investigating the film morphologies.
-
X-ray photoelectron spectroscopy
PHI Quantera II
Thermo Fisher Scientific
Used for characterizing the chemical compositions of the polymers.
-
PEIE
Sigma Aldrich
Used as a base material for preparing non-conjugated polymers PEIE-DBO and PEIE-DCO.
-
PTB7-Th
1-Material Inc.
Used as a photoactive material in the organic solar cells.
-
PC71BM
Solarmer Materials Inc.
Used as a photoactive material in the organic solar cells.
-
PM6
Used as a photoactive material in the non-fullerene organic solar cells.
-
Y6
Shenzhen Derthon Optoelectronic Materials Science & Technology Co.
Used as a photoactive material in the non-fullerene organic solar cells.
-
1,8-dibromooctane
Alfa Aesar
Used in the quaternization of polyethyleneimine ethoxylate to prepare PEIE-DBO.
-
1,8-dichlorooctane
Tokyo Chemical Industry
Used in the quaternization of polyethyleneimine ethoxylate to prepare PEIE-DCO.
-
AM 1.5 Global solar simulator
Enlitech
Used for simulating sunlight to test the solar cells.
-
Surface profiler
XP-100
Used for measuring the film thickness.
-
Ultraviolet photoelectron spectrometer
Used for determining the work function of the materials.
-
登录查看剩余12件设备及参数对照表
查看全部