研究目的
Investigating the preparation and characterization of Sb2Se3 thin films for photovoltaic device applications, focusing on structural, optical, optoelectrical, and photovoltaic properties.
研究成果
The study successfully prepared and characterized Sb2Se3 thin films with promising properties for photovoltaic applications. The films exhibited polycrystalline structure, direct optical transitions, and a solar efficiency of 4.03% in the fabricated heterojunction device. Future studies could focus on optimizing film deposition techniques and device architecture to enhance efficiency.
研究不足
The study is limited to the characterization of Sb2Se3 thin films prepared by thermal evaporation. The efficiency of the fabricated solar cell is relatively low, indicating potential areas for optimization in film quality and device structure.
1:Experimental Design and Method Selection:
The study employed thermal evaporation for the synthesis of Sb2Se3 thin films of varying thicknesses. Structural, morphological, and optical characterizations were conducted to assess the films' properties.
2:Sample Selection and Data Sources:
Sb2Se3 thin films with thicknesses of 241, 315, 387, and 429 nm were prepared. The bulk material was synthesized from pure elements (Sb and Se) in a vacuum silica tube.
3:List of Experimental Equipment and Materials:
Equipment included an X-ray diffraction instrument (X’Pert), field emission scanning electron microscopy (FESEM, Quanta FEG 250), energy-dispersive X-ray spectrometer (EDXS), spectrophotometer (SP, V-570, JASCO), electrometer (Keithley-2635 A), and C–V meter. Materials included Sb (99.999%) and Se (99.999%).
4:999%) and Se (999%). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The synthesis involved direct fusion of Sb and Se, followed by thermal evaporation to deposit thin films. Characterization included XRD, FESEM, EDXS, optical transmittance and reflectance measurements, and photovoltaic performance assessment.
5:Data Analysis Methods:
Data analysis involved Scherer formula for grain size calculation, Swanepoel’s method for refractive index determination, and Tauc’s relation for bandgap energy estimation.
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Field emission scanning electron microscopy
Quanta FEG 250
FEI
Examine the morphology and the elemental composition of the as-deposited Sb2Se3 thin films
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Spectrophotometer
SP, V-570
JASCO
Investigate the transmittance (T) and reflectance (R) optical data
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X-ray diffraction instrument
X’Pert
Study the crystal structure of the as-deposited Sb2Se3 thin films
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Energy-dispersive X-ray spectrometer
EDXS
Elemental composition analysis
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Electrometer
Keithley-2635 A
Measure the current–voltage (I–V) characteristic
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C–V meter
Characterize the dark capacitance–voltage (C–V) estimations
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Halogen lamp
Generate light for illumination process
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Solar power meter
Measure the intensity of the incident light
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