研究目的
To improve the quality of perovskite films and the photovoltaic performance of perovskite solar cells by introducing a pre-preparation step for perovskite crystal particles in the conventional two-step spin-coating method.
研究成果
The pre-preparation of perovskite crystal particles improved the quality of perovskite films, leading to enhanced photovoltaic performance of the corresponding devices. The optimal amount of CH3NH3PbI3 resulted in a significant increase in Jsc and FF values, and the PCE increased from 11.7% to 17.5%. The compact structure and enlarged grain size also enhanced the stability of the devices in air.
研究不足
The study found that excessive concentrations of CH3NH3PbI3 produced pin-holes in the films, which deteriorated the surface morphology. The optimal amount of CH3NH3PbI3 was crucial for achieving high-quality films.
1:Experimental Design and Method Selection:
The study improved the conventional two-step spin-coating method by adding CH3NH3I into the PbI2 precursor solution and performing anti-solvent extraction to produce perovskite crystal particles in the PbI2 layers.
2:Sample Selection and Data Sources:
Perovskite films were prepared on Schott glass and ITO-coated glass substrates. The films' microstructure and photo-electrical properties were characterized.
3:List of Experimental Equipment and Materials:
Materials included N-dimethylformamide (DMF), dimethyl sulfoxide (DMSO), anhydrous isopropanol (IPA), chlorobenzene (CB), Acetonitrile (CAN), PbI2, CH3NH3I (MAI), CH3NH3Br (MABr), Spiro-OMeTAD, bistri-uoromethanesulfonimide lithium (Li-TFSI), 4-tert-butylpyridine (tBP), urea, HCl, mercaptoacetic acid, SnCl2·2H2O, SnO2, and gold electrode. Equipment included FEI NOVA NANOSEM 450 SEM, Bruker D8 X-ray diffractometer, Hitachi U-4100 UV-Vis spectrophotometer, Edinburgh Instrument FLS920, Agilent B1500A Semiconductor parameter analysis instrument, and SPIQE200-5031 AC/DC I/EQE system.
4:Experimental Procedures and Operational Workflow:
The process involved preparing precursor solutions, fabricating devices with ITO/SnO2/MAPbI3/Spiro/Au structure, and characterizing the films and devices.
5:Data Analysis Methods:
The study analyzed the films' microstructure, absorption spectra, photoluminescence spectra, and the devices' photovoltaic performance parameters.
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Edinburgh Instrument FLS920
FLS920
Edinburgh Instrument
Used to record the steady-state photoluminescence spectra (SSPL) of the films.
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Agilent B1500A Semiconductor parameter analysis instrument
B1500A
Agilent
Used to measure the J-V curves of the devices under AM1.5 illumination.
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FEI NOVA NANOSEM 450
NOVA NANOSEM 450
FEI
Cold field scanning electron microscopy (SEM) system used to observe the surface morphology of the films.
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Bruker D8 X-ray diffractometer
D8
Bruker
Used to collect the X-ray diffraction (XRD) patterns of the films.
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Hitachi U-4100 UV-Vis spectrophotometer
U-4100
Hitachi
Used to measure the absorption spectra of the films.
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SPIQE200-5031 AC/DC I/EQE system
SPIQE200-5031
Newport Corporation
Used to measure the external quantum efficiencies (EQE) in AC mode.
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