摘要： In this study, interfacial recombination observed by activation energy (Ea) is reduced with an improvement in the built-in potential (Vbi) by raising the conduction band minimum (EC) in Al-doped (Zn, Mg)O (AZMO) layer for pure-sul?de Cu(In, Ga)S2 (CIGS) solar cells. It is observed that the optical band gap in AZMO ?lms can be widened from 3.56 to 3.97 eV with increasing Mg/(Mg + Zn) ratio from 0 to 0.23, suggesting the shift of EC toward the vacuum level. AZMO layers with Mg/(Mg + Zn) ratio of 0–0.23 are applied as transparent conductive oxide (TCO) for the pure-sul?de CIGS solar cells. The open-circuit voltage is clearly enhanced from 0.641 to 0.713 V with increasing Mg/(Mg + Zn) ratio from 0 to 0.09 and then decreased to 0.651 V at Mg/(Mg + Zn) ratio of 0.23 in the AZMO layer. Reverse saturation current density (J0) was minimized to 9.4 × 10?7 A/cm2 at Mg/(Mg + Zn) of 0.09, although J0 was 4.7 × 10?6 A/cm2 in Al-doped ZnO (Mg/(Mg + Zn) of 0). From Mott-Schottky plot, it is observed that Vbi for the pure-sul?de CIGS solar cells gradually enhanced with an increase in Mg/(Mg + Zn) from 0 to 0.23 in the AZMO layer. These results suggest that Vbi improves by controlling EC in the TCO layer, which ultimately reduces the recombination at the hetero interface owing to strengthened electric ?eld.