研究目的
Investigating the photocatalytic effects of a novel 0.4BWO/g-C3N4 heterostructure on the degradation of cationic/anionic dyes and the reduction of N2 under visible light illumination.
研究成果
The 0.4BWO/g-C3N4 heterostructure demonstrates enhanced photocatalytic performance for the degradation of cationic/anionic dyes and N2 reduction under visible light illumination, attributed to the effective separation of photogenerated electron-hole pairs and the Z-scheme electron transfer pathway. The composite is stable and reusable, making it a promising candidate for environmental remediation and energy applications.
研究不足
The study focuses on the photocatalytic performance under visible light illumination and does not explore the effects under other light conditions. The scalability and practical application in large-scale wastewater treatment are not addressed.
1:Experimental Design and Method Selection:
Microwave-assisted synthesis of BWO and solvent evaporation method for BWO/g-C3N4 heterostructure.
2:Sample Selection and Data Sources:
Use of melamine, ethylenediamine, ethylene glycol, ethanol, Bi(NO3)
3:5H2O, Na2WO2H2O, and rhodamine B (RhB). List of Experimental Equipment and Materials:
PAN analytical Empyrean X-ray diffractometer, JEM-2100 JEOL transmission electron microscope, JSM 7600F JEOL field emission scanning electron microscope, Quantachrome NOVA Touch surface area analyzer, HITACHI TG-DTA 7200, Varian Carry 5000 spectrophotometer, Hitachi F-4000 spectrofluorimeter, IVIUM vertex 1A potentiostat, Water Micro mass Q-TOF mass spectrometer.
4:Experimental Procedures and Operational Workflow:
Synthesis of bulk g-C3N4, BWO, and BWO/g-C3N4 composite, photocatalytic dye degradation activity, photocatalytic nitrogen reduction activity.
5:Data Analysis Methods:
UV-visible spectrophotometry, photoluminescence, time-resolved fluorescence, impedance spectroscopy.
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Powder X-ray diffractometer
PAN analytical Empyrean
PANalytical
Characterization of crystal structure
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Transmission electron microscope
JEM-2100
JEOL
Morphology analysis
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Field emission scanning electron microscope
JSM 7600F
JEOL
Surface morphology and elemental analysis
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Thermogravimetric analyzer
HITACHI TG-DTA 7200
Hitachi
Thermal stability analysis
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Spectrofluorimeter
Hitachi F-4000
Hitachi
Photoluminescence analysis
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Surface area analyzer
Quantachrome NOVA Touch
Quantachrome
Surface area determination
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UV-Vis spectrophotometer
Varian Carry 5000
Varian
Optical properties analysis
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Potentiostat
IVIUM vertex 1A
IVIUM
Electrochemical measurements
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Electrospray ionization mass spectrometer
Water Micro mass Q-TOF
Waters
Intermediate analysis during photocatalytic degradation
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