研究目的
Investigating the effects of La3+ ions on the enhancement of NIR quantum cutting and upconversion emissions in Nd3+–Yb3+ co-doped transparent silicate glass-ceramics for solar cells.
研究成果
The study successfully demonstrated the enhancement of NIR QC and UC emissions in Nd3+–Yb3+ co-doped transparent SGC with increasing LaF3 concentration up to 25 mol. %. The maximum NIR QC emission intensity was achieved at this concentration, with further increases leading to a decrease due to the self-quenching effect. The materials developed in this study have potential applications in solar cells and optical amplifiers.
研究不足
The study is limited by the self-quenching effect observed at higher concentrations of Yb3+ and the need for further optimization of LaF3 concentration to maximize NIR QC and UC emission intensity.
1：Experimental Design and Method Selection:
The study involved preparing Nd3+–Yb3+ co-doped Si–Al–Ba–La transparent silicate glass-ceramics (SGC) and investigating the influence of La3+ on NIR QC and UC emission intensity.
2：Sample Selection and Data Sources:
High-purity SiO2, AlF3, BaF2, LaF3, NdF3, and YbF3 were used as starting materials.
3：List of Experimental Equipment and Materials:
Differential thermal analysis (DTA) was carried out using a Shimadzu DTA-60AH, X-ray diffraction (XRD) patterns were measured on a Rigaku D/max-IIIA diffractometer, transmission electron microscopy (TEM) was performed using a JEM–2100, and optical absorption spectrum was measured using a Hitachi U–4100 spectrophotometer.
4：Experimental Procedures and Operational Workflow:
Glass samples were prepared and heat-treated within specific temperature ranges. DTA, XRD, TEM, and optical absorption measurements were conducted.
5：Data Analysis Methods:
The Scherrer equation was used to calculate crystal size, and decay lifetimes were measured on an Edinburgh Instruments FLS980 fluorescence spectrometer.
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Shimadzu DTA-60AH
DTA-60AH
Shimadzu
Differential thermal analysis of glass samples.
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Rigaku D/max-IIIA diffractometer
D/max-IIIA
Rigaku
Measurement of X-ray diffraction patterns.
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JEM–2100
JEM–2100
JEOL
Characterization of nanocrystals sizes and structure.
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Hitachi U–4100 spectrophotometer
U–4100
Hitachi
Measurement of optical absorption spectrum.
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Edinburgh Instruments FLS980 fluorescence spectrometer
FLS980
Edinburgh Instruments
Measurement of decay lifetimes and NIR QC spectra.
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