研究目的
Investigating the near-field enhancement on an AFM tip irradiated by an annular laser beam for applications in nanofabrication.
研究成果
The simulation demonstrates that annular laser beam irradiation on an AFM tip produces significant near-field enhancement, especially at higher frequencies, specific angles (60 Deg), and distances (65 nm). This system shows promise for advanced nanofabrication techniques.
研究不足
The study is based on numerical simulations, which may not fully capture all physical phenomena in real-world applications. Experimental validation is needed to confirm the findings.
1:Experimental Design and Method Selection:
The study employs COMSOL Multiphysics
2:2a to simulate the near-field interaction between the tip and the sample based on Maxwell’s equations. Sample Selection and Data Sources:
The AFM tip is modeled with specific parameters (R = 20 nm, α = 75Deg) and materials (Au for the tip, Ag for the particle, Si for the substrate).
3:List of Experimental Equipment and Materials:
COMSOL Multiphysics software is used for simulations.
4:Experimental Procedures and Operational Workflow:
The simulation involves varying laser wavelengths, irradiation angles, and distances to analyze their effects on near-field enhancement.
5:Data Analysis Methods:
The electric field distribution is analyzed to determine the conditions for maximum near-field enhancement.
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