研究目的
To synthesize a durable perovskite quantum dots film with near unity photoluminescence quantum yield for efficient perovskite light emitting diode.
研究成果
A bright uniform durable PSK QDs film was formed in situ using an amorphous polymer containing coordinating groups and optimized stoichiometry. The film showed a PLQY as high as 98% even under low light intensities and retained 100% of the initial PLQY after 2 years. Highly efficient green PLED devices were fabricated without electron transporting layer with a current efficiency of 48.18 cd/A and maximum EQE of 10.5%. The flexible PLED based on PSK QDs with a maximum luminance of 43990 cd m?2 was also fabricated.
研究不足
The study focuses on the synthesis and characterization of PSK QDs film and its application in PLEDs. The limitations include the specific conditions required for the synthesis and the need for further optimization for industrial applications.
1:Experimental Design and Method Selection:
The synthesis involves using an amorphous polymer (poly(vinylpyrrolidone)) and optimizing the stoichiometry to form PSK QDs film in situ.
2:Sample Selection and Data Sources:
CH3NH3Br and PbBr2 are dissolved in anhydrous DMF at 1M concentration. PVP is dissolved in DMF at
3:2 mg/ml concentration. List of Experimental Equipment and Materials:
Field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), transmission electron microscopy (TEM), UV-Visible spectrophotometer, spectrofluorometer, X-ray diffraction (XRD) spectra, Ivium stat potentiostat.
4:Experimental Procedures and Operational Workflow:
Different stoichiometry ratios of MABr: PbBr2 precursors and different concentrations of PVP are investigated. The precursor solution is spin-coated on substrates and annealed.
5:Data Analysis Methods:
The morphology, absorption spectra, PL spectra, PLQY, and device performance are analyzed.
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Atomic force microscopy
CP-Research
Veeco
Taking PSK layer surface topography images
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UV-Visible spectrophotometer
AvaSpec 2048
Avantes
Recording the absorption spectra of the PSK layers
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Spectrofluorometer
Frontier
Perkin-Elmer
Taking the PL spectra of the PSK films
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Field emission scanning electron microscopy
TESCAN-LMU
TESCAN
Characterization of the morphology of the films
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Transmission electron microscopy
CM30
Philips
Determining the exact size of the PSK QDs
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X-ray diffractometer
X'Pert MPD
Philips
Investigating the crystalline nature of perovskite films
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Potentiostat
XRE
Ivium stat
Measuring current-voltage characteristics of the fabricated devices
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