研究目的
Investigating the subsurface damage and phase transformation in single crystal silicon caused by laser-assisted nanometric cutting.
研究成果
Laser-assisted nanometric cutting enhances the plastic deformability of single crystal silicon, leading to a larger critical ductile-brittle transition depth of cut and reduced subsurface damage. The process induces phase transformations and increases dislocation activity, improving material removal mechanisms.
研究不足
The study focuses on single crystal silicon and may not be directly applicable to other materials. The effects of varying laser parameters and cutting conditions beyond those tested are not explored.
1:Experimental Design and Method Selection:
The study involved ultraprecision cutting experiments and molecular dynamics simulation to investigate subsurface damage and phase transformation in single crystal silicon.
2:Sample Selection and Data Sources:
Double-side polished Si (100) wafers were used in the experiments.
3:List of Experimental Equipment and Materials:
A Precitech Nanoform X? ultra-precision machine tool, natural diamond cutting tools, a continuous wave fiber laser device, and a white light interferometer (WLI, ZYGO Newview 9000) were used.
4:Experimental Procedures and Operational Workflow:
The experiments included laser-assisted diamond cutting tests with varying depths of cut and laser powers.
5:Data Analysis Methods:
Transmission electron microscopy (TEM) and Raman spectroscopy were used for phase structure characterization and subsurface damage analysis.
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