研究目的
Investigating the effects of oxidation on the degradation of the underlying semiconductor circuitry of the solar panels and the effect of aging on the life of the solar photovoltaic systems.
研究成果
The study concludes that after one year of installation in field, conversion efficiency of silicon solar photovoltaic module is reduced by 2.48% and then 0.78% every year. The degradation rate (DR) may lie as 2.0% ≤ DR (1) ≤ 2.5% within first year and 0.67 ≤ DR (1+) ≤ 1 beyond.
研究不足
The study is limited to the effects of oxidation and aging on silicon solar photovoltaic modules. The research does not cover other types of solar cells or modules.
1：Experimental Design and Method Selection:
The research methodology is based on monitoring, testing and evaluating the real time power and efficiency using image analysis.
2：Sample Selection and Data Sources:
The study involves two PV modules manufactured in 2015 and
3：List of Experimental Equipment and Materials:
20 Portable Monocular Metallurgical Microscope MODEL-XC-100L with Camera: Model: PULSE Sensor Size: 1/3 CMOS,
4：2MP Global Shutter, Pixel Size:
5：75 mm x 75 mm. Experimental Procedures and Operational Workflow:
Defective images are collected and analyzed through photoluminescence (PL) imaging.
6：Data Analysis Methods:
The electrical data such as voltage, current, maximum power and efficiency are collected and analyzed.
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