摘要： Tip-enhanced Raman Spectroscopy (TERS) is capable of amplifying the extremely weak Raman response of azobenzene self-assembled monolayers (SAMs), thus allowing for the chemical characterization of the sample surface at the nanoscale. Recently, we introduced a physical model describing the TERS intensity of azobenzene SAMs probed in a scanning tunneling mode configuration (STM-TERS), that takes into account the molecular bending induced by the high electric field inside the tunneling junction. The model predicts quite well the experimental variation in the TERS intensity of a hexil azobenzene SAM (AzoC6) on gold polycrystalline film (111) with changing the electric field in the gap between the tip and the substrate. Nevertheless, a disagreement between the model and the experiment has been observed while studying, in the same conditions, the TERS intensity of undecyl azobenzene (AzoC11) SAM formed by molecules featuring an alkyl chain nearly two times longer with respect to the previous case. In this work we extend the molecular bending model through considering an additional bending mechanism due to the mechanical interaction between the tip and the SAM, occurring when the tip-to-sample distance is shorter than the molecular length. The extended model is able to describe well the TERS intensity behavior with changing either the bias voltage or the tip-to-sample distance for both AzoC6 and AzoC11. Eventually, we determine quantitatively the difference in elastic properties of the two molecules physically accounting for the difference in the TERS intensity behavior of the two SAMs.