研究目的
Demonstrating the conversion of a single emissive layer OLED from blue to white by utilizing the Bragg modes of a dielectric distributed Bragg reflector (DBR) to address the challenges in device design and performance improvements of white-light OLEDs.
研究成果
The study successfully demonstrated the conversion of a blue OLED to white by utilizing the Bragg modes of a DBR, showing significant improvements in external quantum efficiency and color temperature tunability. The Bragg converter concept offers a promising method for suppressing efficiency roll-off in WOLEDs and enables independent optimization of internal quantum efficiency and color temperature.
研究不足
The study focuses on a proof-of-concept demonstration and does not extensively explore the long-term operational stability or scalability of the fabrication process. The efficiency improvements are noted above certain current densities, and the color temperature stability is limited to detection angles up to ~25°.
1:Experimental Design and Method Selection:
The study involved designing a WOLED with a sub-100 nm-thick blue single emissive layer coupled to the photonic Bragg modes of a dielectric DBR. Transfer matrix simulations were used to design the DBR and predict the electric field antinodes.
2:Sample Selection and Data Sources:
The OLED part was fabricated using standard vacuum evaporation methods on square quartz substrates. The DBR was directly sputtered on top of the OLED.
3:List of Experimental Equipment and Materials:
Equipment included vacuum evaporation systems (Edwards E306), sputtering deposition system (Kurt J. Lesker), ellipsometry (J.A. Woollam M2000), and profilometry (Bruker DektakXT). Materials included TDAF, BPhen, LiF, Al, MoO3, SiO2, and Ta2O
4:Experimental Procedures and Operational Workflow:
The OLED fabrication involved two stages of deposition, followed by DBR encapsulation. Characterization included electrical and optical measurements using a power source meter and a spectrometer coupled to a CCD camera.
5:Data Analysis Methods:
The external quantum efficiency was calculated from the spectrally integrated electroluminescence distribution. Transfer matrix method was used for simulations.
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J.A. Woollam M2000
M2000
J.A. Woollam
Ellipsometry for film thickness and optical constants measurement
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Bruker DektakXT
DektakXT
Bruker
Profilometry for film thickness measurement
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Keithley 2602B
2602B
Keithley
Power source meter for electrical characterization
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OceanOptics USB2000
USB2000
OceanOptics
Miniature spectrometer for reflectivity measurements
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TDAF
Emissive layer material in OLED
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BPhen
Hole-blocking layer material in OLED
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LiF
Part of the cathode in OLED
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Al
Cathode and anode material in OLED
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MoO3
Hole-injecting layer material in OLED
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SiO2
Low refractive index material in DBR
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Ta2O5
High refractive index material in DBR
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Edwards E306
E306
Edwards
Vacuum evaporation system for OLED fabrication
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Kurt J. Lesker
Kurt J. Lesker
Sputtering deposition system for DBR fabrication
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Pixis 400
400
Pixis
2D CCD camera for optical characterization
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Acton SpectrPro 2500
SpectrPro 2500
Acton
Spectrometer for optical characterization
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