研究目的
Investigating the degradation mechanisms of nitride-based near-ultraviolet light-emitting diodes under bias stress in salt water vapor ambient.
研究成果
The accelerated erosion of ITO is found to be induced by accumulated NaCl at ITO surface around high surface temperature region. The eroded ITO enhanced Au atom of the electrode diffusing into the active region, which leads to severe leakage current hence the malfunction of the LED device. The fast screening technique techniques provides an effective method of life test of ultraviolet LED.
研究不足
The study focuses on nitride-based near-UV LEDs and may not be directly applicable to other types of LEDs. The accelerated life test in salt water vapor ambient may not fully replicate real-world operating conditions.
1：Experimental Design and Method Selection:
The study involved applying forward- and reverse-bias stresses to nitride-based near-UV LEDs in a salt water vapor ambient to analyze degradation mechanisms.
2：Sample Selection and Data Sources:
Nitride-based near-UV LEDs with a size of 106 μm2 were prepared on a c-plane sapphire substrate.
3：List of Experimental Equipment and Materials:
Scanning electron microscopy (SEM) with focused ion beam, electron spectroscopy for chemical analysis, laser scanning confocal microscopy, optical microscopy, and an infrared thermal camera system were used.
4：Experimental Procedures and Operational Workflow:
The LEDs were stressed under forward and reverse bias in salt water vapor ambient, followed by analysis of their thermal, optical, and compositional properties.
5：Data Analysis Methods:
Energy dispersive X-ray analysis and electron spectroscopy for chemical analysis were employed to characterize the compositions of the samples.
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