研究目的
Investigating the influence of local distributions of electrical parameters and broken fingers on luminescence images at various working conditions in silicon solar cells using lock-in carrierography.
研究成果
LIC, as a quantitative luminescence-based methodology, can spatially resolve electrical parameters of silicon solar cells, with simulation and experimental results showing good agreement. The method is effective for identifying broken fingers and inhomogeneities in electrical parameters.
研究不足
The theoretical model did not initially account for local series resistance, and the camera pixel size was larger than the finger width, limiting the detailed observation of broken fingers.
1：Experimental Design and Method Selection:
The study employed 2D finite-element simulations and lock-in carrierography (LIC) measurements to investigate the effects of electrical parameters and broken fingers on luminescence images.
2：Sample Selection and Data Sources:
A monocrystalline silicon solar cell with dimensions of 40 mm × 20 mm ×
3：2 mm was used for LIC measurements. List of Experimental Equipment and Materials:
A 45-W/808-nm fiber-coupled diode laser, NIR camera (pixel sizes 640 × 512, spectral bandwidth
4：9–7 mm) with a long-pass filter (~1000 nm), and a data acquisition module were used. Experimental Procedures and Operational Workflow:
LIC measurements were performed at various working conditions, including open-circuit and maximum power point conditions, to derive spatially resolved electrical parameters.
5：Data Analysis Methods:
The relationship between luminescence intensity and local implied voltage was analyzed using a fitting model based on Eq. 1.
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