研究目的
Investigating the improvement of contact performances between two-dimensional InSe films and metal electrodes for flexible nanoelectronics devices by designing a lateral self-assembled CuInSe2/InSe isotype heterojunction.
研究成果
The lateral self-assembled CuInSe2/InSe isotype heterojunction significantly improves the contact performance between InSe films and electrodes, demonstrating quasi-Ohmic contact characteristics, reduced channel resistance, and enhanced photocurrent. The heterojunction also shows promising flexibility, with the ability to maintain performance under bending states by restraining the dark current. This work highlights the potential of CuInSe2/InSe heterojunctions for flexible optoelectronic applications.
研究不足
The study is limited by the specific conditions of the PLD process and the materials used. The performance of the heterojunction under extreme bending conditions and long-term stability were not extensively explored.
1:Experimental Design and Method Selection:
The study utilized pulsed laser deposition (PLD) to fabricate a lateral CuInSe2/InSe isotype heterojunction on a flexible mica substrate. The PLD technique was chosen for its advantages in maintaining stoichiometry and controlling film thickness.
2:Sample Selection and Data Sources:
The samples were prepared by depositing InSe films on mica substrates with pre-patterned Cu or Au electrodes. The stoichiometry and phase of the films were analyzed using X-ray diffraction (XRD) and Raman spectroscopy.
3:List of Experimental Equipment and Materials:
Key equipment included a KrF excimer pulsed laser for PLD, XRD for structural analysis, Raman spectroscopy for vibrational analysis, scanning electron microscopy (SEM) for morphology observation, X-ray photoelectron spectroscopy (XPS) for chemical composition analysis, and atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) for surface potential and thickness measurements.
4:Experimental Procedures and Operational Workflow:
The InSe films were deposited on heated mica substrates under controlled argon pressure. The structural, chemical, and electronic properties of the heterojunction were systematically characterized.
5:Data Analysis Methods:
The electronic band structure and charge transfer mechanism were analyzed using KPFM results. The photoelectric properties were measured under laser illumination, and the performance under bending states was evaluated.
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Atomic force microscope
Bruker Dimension Icon SPM
Bruker
Used for obtaining thickness and surface potential images of the films.
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Kelvin probe force microscope
Bruker Dimension Icon SPM
Bruker
Used for measuring the surface potential of the films.
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Keithley 4200-SCS
4200-SCS
Keithley
Used for measuring the optoelectronic properties of the devices under illumination.
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X-ray diffractometer
Bruker D8 Advance
Bruker
Used for structural analysis of the films.
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X-ray photoelectron spectroscopy system
RBD-upgraded PHI-5000C ESCA
PerkinElmer
Used for analyzing the valence states and stoichiometries of the films.
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KrF excimer pulsed laser
248 nm
Used for pulsed laser deposition (PLD) to fabricate the CuInSe2/InSe heterojunction.
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Raman spectrometer
Jobin-Yvon LabRAM HR Evolution
Jobin-Yvon
Used for vibrational analysis of the films.
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Scanning electron microscope
PHILIPS XL30TMP
PHILIPS
Used for observing the surface morphologies of the films.
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