研究目的
To synthesize a new electropolymerized film (p-TPCF) and apply it to tune the work-function of PEDOT:PSS hole-transporting layer in organic solar cells for enhanced device performance.
研究成果
The introduction of p-TPCF EP film on PEDOT:PSS HTL in OSCs leads to enhanced device performance due to deeper WF, larger Vbi, decreased recombination, and longer carrier lifetime. This work provides a new conjugated EP film for anode modification with potential applications in photovoltaic devices.
研究不足
The study focuses on a specific type of organic solar cell and a particular electropolymerized film. The generalizability to other systems and the long-term stability of the EP film-modified devices are not extensively discussed.
1：Experimental Design and Method Selection
Electrochemical cyclic voltammetry method was used to in-situ synthesize p-TPCF film on PEDOT:PSS. Techniques like KPFM, light intensity dependent solar cell characterization, Mott-Schottky analysis, TPV, and TPC measurements were employed to study the effects.
2：Sample Selection and Data Sources
PTB7-Th:PC71BM was used as the active layer in OSCs. The devices were fabricated with a conventional structure: ITO/HTL/PCE-10:PC71BM/PFN-Br/Al.
3：List of Experimental Equipment and Materials
PEDOT:PSS, PTB7-Th, PC71BM, PFN-Br, TPCF monomer, TBAP, DIO, CB, acetonitrile, DCM, IPA, UV-ozone cleaner, spin coater, Keithley 2400, solar simulator, FT-IR spectrometer, UV-Vis spectrometer, PL spectrometer, AFM, KPFM, TPV, TPC systems.
4：Experimental Procedures and Operational Workflow
Cleaning ITO substrates, spin-coating PEDOT:PSS, electropolymerizing p-TPCF, spin-coating active layer and PFN-Br, evaporating Al cathode, characterizing device performance and film properties.
5：Data Analysis Methods
Analysis of J-V characteristics, EQE spectra, FT-IR spectra, UV-Vis spectra, PL spectra, AFM and KPFM images, TPV and TPC decay times, Mott-Schottky analysis.
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UV-Vis spectrometer
Lambda 950
Perkin Elmer
Ultraviolet-visible absorption spectroscopy
-
AFM
Multimode-8
Bruker
Atomic force microscopy
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KPFM
Multimode-8
Bruker
Kelvin probe force microscopy
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PEDOT:PSS
CLEVIOSTM PVP Al 4083
Heraeus
Hole-transporting layer in organic solar cells
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Keithley 2400
2400
Keithley
Precision Source/Measure unit for J-V characteristics
-
Solar simulator
XES-70S1
SANYOU Electric Co., Ltd.
Standard AM 1.5G solar irradiation source
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FT-IR spectrometer
Spectrum One
Fourier transform infrared spectroscopy
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PL spectrometer
Nano LOG-TCSPC
Photoluminescence spectroscopy
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TPV
Physike Technology Co., Ltd
Transient photovoltage measurements
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TPC
Physike Technology Co., Ltd
Transient photocurrent measurements
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