研究目的
To propose a procedure to build and set up a high resolution EL camera for crystalline Si modules, equipped with a low-cost Si sensor, for detecting common defects in PV modules both indoor and outdoor.
研究成果
The study demonstrates that a modified commercial CMOS camera can be effectively used for EL tests on PV modules, providing comparable results to more expensive InGaAs cameras. The combined use of I-V curves and EL images allows for a comprehensive analysis of PV module performance and defect identification.
研究不足
The modified CMOS camera has a relatively poor response over the 1000—1200 nm region compared to InGaAs sensors. The absence of automatic focus in the selected lens requires continuous manual focus adjustment.
