研究目的
Investigating the effect of Ag doping concentration on the structural, morphological, optical, photoluminescence, and electrical properties of PbS thin films for solar cell applications.
研究成果
Ag doping enhances the structural, optical, and electrical properties of PbS thin films, making them suitable for solar cell applications. The optimal Ag doping concentration was found to be 6%, which resulted in the lowest resistivity and highest carrier concentration. The fabricated FTO/CdS/PbS:Ag heterostructure solar cell achieved a conversion efficiency of 0.89%.
研究不足
The study is limited to the effects of Ag doping concentration up to 8% on PbS thin films. The efficiency of the fabricated solar cell is relatively low (0.89%), which may be due to defects during preparation and lattice mismatch between layers.
1:Experimental Design and Method Selection
Nebulizer spray pyrolysis (NSP) method was used to prepare Ag-doped PbS thin films on glass substrates at 200°C with different Ag doping concentrations (2% to 8%).
2:Sample Selection and Data Sources
Analytical grade lead nitrate (PbNO3), thiourea (CS(NH2)2), and silver nitrate (AgNO3) were used as starting materials. The substrates were cleaned with chromic acid, distilled water, methanol, and acetone.
3:List of Experimental Equipment and Materials
Stylus profilometer (SJ-301), X-ray diffractometer (PAN analytical X' Pert PRO), scanning electron microscope (SEM) (EVO 18 ZEISS), Lambda Perkin Elmer UV-Vis Spectrophotometer, Keithley source-meter (model number 2450).
4:Experimental Procedures and Operational Workflow
The spray solution was prepared with a 1:1M ratio of lead nitrate and thiourea dissolved in deionized water, with different concentrations of Ag dopant added. The solution was sprayed onto the substrate at 200°C using an air compressor. The distance between the deposition surface and the spray nozzle was set at 5 cm.
5:Data Analysis Methods
Structural properties were analyzed using XRD, morphology and elemental composition by SEM and EDS, optical properties by UV-Vis spectrophotometry, and electrical properties by Hall effect measurements.
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X-ray diffractometer
PAN analytical X' Pert PRO
PANalytical
Analyzing the structural properties of the films.
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Scanning electron microscope
EVO 18
ZEISS
Analyzing the morphology and elemental composition of the films.
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UV-Vis Spectrophotometer
Lambda
Perkin Elmer
Measuring absorption/transmittance spectra and optical band gap.
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Source-meter
2450
Keithley
Performing I-V measurements.
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Stylus profilometer
SJ-301
Determining the thickness of the films.
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