研究目的
To study the contributions of the third end‐member BiMnO3 to the reduction in the leakage current and the enhancement of the piezoelectric properties of Bi0.5Na0.5TiO3‐BaTiO3 thin films.
研究成果
The addition of 1 mol% BiMnO3 can reduce the leakage current by reducing oxygen vacancies and enhance the piezoelectric and ferroelectric properties of BNT–BT thin films, achieving a high Smax/Emax value of 100.4 pm/V.
研究不足
The study is limited to the effects of BiMnO3 content on the electrical properties of BNT–BT–BMO thin films, and the solubility of BiMnO3 in BNT–BT may limit its effectiveness beyond certain concentrations.
1：Experimental Design and Method Selection:
The study involved fabricating (1 ? x)(
2：94Bi5Na5TiO3‐06BaTiO3)–xBiMnO3 thin films with varying x values using the metal organic decomposition method. Sample Selection and Data Sources:
Thin films with x = 0,
3：005, 01, and 015 were prepared. List of Experimental Equipment and Materials:
Bismuth(III) nitrate pentahydrate, sodium acetate trihydrate, barium acetate, manganese(II) acetate tetrahydrate, titanium(IV) n‐butoxide, anhydrous acetic acid, 2‐methoxyethanol, and acetylacetone were used.
4：Experimental Procedures and Operational Workflow:
The films were deposited by spin coating on Pt(111)/Ti/SiO2/Si(100) substrates, followed by heat treatment and annealing. Gold electrodes were deposited for electrical measurements.
5：Data Analysis Methods:
The crystalline structures were identified using an X‐ray diffractometer, and electrical properties were measured using various instruments including an LCR meter and a ferroelectric test system.
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scanning electron microscope
JEOL JSM‐6490LV
JEOL
Determining the thicknesses and surface morphology of the films
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LCR meter
Agilent E4980A
Agilent
Capacitance and dielectric loss measurements
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source meter
Keithley 2410
Keithley
Measuring leakage currents
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ferroelectric test system
Radiant Precision Premier II
Radiant
Obtaining P‐E loops
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piezoresponse force microscope
Bruker Dimension Icon
Bruker
Measuring electric field‐induced strain and phases
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X‐ray diffractometer
Bruker D8 ADVANCE
Bruker
Identifying the crystalline structures of the thin films
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