研究目的
Investigating the enhancement of efficiency and stability in inverted planar perovskite solar cells by using NiOx nano film as the hole transporting layer compared to PEDOT:PSS.
研究成果
The NiOx nano film as a hole transporting layer significantly enhances the efficiency and stability of inverted planar perovskite solar cells compared to PEDOT:PSS, due to larger grain size, lower defect density, and higher built-in potential. This approach shows promise for the development of highly efficient and stable perovskite solar cells.
研究不足
The study focuses on the comparison between NiOx and PEDOT:PSS as HTLs in inverted planar perovskite solar cells. The scalability and cost-effectiveness of the sol–gel method for NiOx film fabrication in large-scale production were not addressed.
1:Experimental Design and Method Selection:
The study employed a sol–gel method to fabricate NiOx nano films as the hole transporting layer for inverted perovskite solar cells. The performance of devices based on PEDOT:PSS and NiOx were systematically compared.
2:Sample Selection and Data Sources:
Perovskite films were deposited on ITO substrates coated with either PEDOT:PSS or NiOx. The samples were characterized using UV-vis spectroscopy, SEM, XRD, and photovoltaic performance measurements.
3:List of Experimental Equipment and Materials:
Instruments included a PerkinElmer Lambda 2S UV-vis spectrometer, Philips XL30 FEG SEM, Philips X0 Pert diffractometer, and a HP4284A semiconductor analyzer for CV and CF measurements. Materials included Ni(OAc)2·4H2O, MEA, ethanol, PEDOT:PSS, and perovskite precursor materials.
4:Experimental Procedures and Operational Workflow:
NiOx precursor solution was spin-coated on ITO substrates and annealed. Perovskite layers were deposited via a one-step method, followed by the deposition of PCBM, BCP, and Ag layers. Devices were characterized for their photovoltaic performance and stability.
5:Data Analysis Methods:
Data analysis included comparing UV-vis absorption, SEM images for grain size, XRD for crystallinity, and CV/CF measurements for defect density and built-in potential.
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