研究目的
Investigating the construction and performance of ZnO/Ag heterostructures for UV photodetectors with near-linear responses in outdoor temperatures.
研究成果
ZnO/Ag heterostructures are an interesting material for UV photodetectors with a near-linear high response under outdoor temperature. The sensitivity of the sensor prepared by ZnO nanowalls/Ag nanowires has a better linear relationship between 10 oC~70 oC.
研究不足
The working temperature in this experiment cannot go below 10 oC due to restrictions of the experimental condition.
1：Experimental Design and Method Selection:
A simple method of sonication combined with annealing treatment was used to construct ZnO/Ag heterostructures.
2：Sample Selection and Data Sources:
Ag nanorods assembled in-situ with ZnO nanowalls were characterized by FESEM, EDS, XRD, XPS, PL, UV-vis spectra.
3：List of Experimental Equipment and Materials:
Zinc acetate, Aluminum nitrate nonahydrate, Hexamethylene tetraamine, Zinc nitrate hexahydrate, Silver nitrate, dip coating machine(SYDC-100H), X-ray diffractometer (XRD, SHIMADZU-6000), scanning electron microscopy (SEM, FEI QAUANTA 400), Transmission electron microscope (TEM, JEOL 2100), photoluminescence spectroscopy (Perkin Elmer LS-55 fluorescence spectrometer), X-ray photoelectron spectrometer (XPS, PHI-5702, Al Kα x-ray radiation).
4：Experimental Procedures and Operational Workflow:
Preparation of the seed layer, formation of ZnO nanowalls, and growth of Ag nanorods in the nanopores of ZnO nanowalls.
5：Data Analysis Methods:
The sensitivity (S) of the sensor is defined as Ra/Rp, where Ra is the resistance of the sensor without UV illumination and Rp is the resistance in UV illumination.
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X-ray diffractometer
SHIMADZU-6000
SHIMADZU
Used for structural identification of the samples.
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scanning electron microscopy
FEI QAUANTA 400
FEI
Used for observing the morphology of the samples.
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Transmission electron microscope
JEOL 2100
JEOL
Used for investigating microstructure of the samples.
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photoluminescence spectroscopy
Perkin Elmer LS-55 fluorescence spectrometer
Perkin Elmer
Used for characterizing the photoluminescence properties of the samples.
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UV illuminant
Zolix MLED 4
Zolix
Used for irradiating the sensor by UV light.
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dip coating machine
SYDC-100H
Used for immersing substrates at a constant speed and vertically placing them in the solution.
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X-ray photoelectron spectrometer
PHI-5702
PHI
Used for surface elemental analysis.
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gas-sensing characterization system
CGS-1TP
Elite Instruments
Used for measuring the photoresponse properties of the samples.
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