研究目的
Investigating the effects of embedding silver nanowires (AgNWs) in PEDOT:PSS on the charge transfer characteristics and planar heterojunction solar cell (HSC) properties.
研究成果
The embedment of AgNWs in PEDOT:PSS enhances the charge transfer characteristics and HSC performance, achieving a high open-circuit voltage of over 638 mV and a power conversion efficiency greater than 15.3%. The study demonstrates the potential of AgNW-embedded PEDOT:PSS hybrid materials for improving the performance of electronic devices.
研究不足
The study is limited by the oxidation of thicker AgNWs, which affects the conductivity of the hybrid films. The influence of dispersing solvents on the properties of PEDOT:PSS and HSCs is found to be minor, suggesting that further optimization may be needed to enhance performance.
1:Experimental Design and Method Selection:
The study involves the embedment of AgNWs in PEDOT:PSS and compares the effects of nanowire-dispersing solvents (ethanol or isopropanol) on the properties of the hybrid films and HSCs. Electrostatic force microscopy (EFM) is used to study charge transfer characteristics.
2:Sample Selection and Data Sources:
AgNWs with diameter ~100 nm and a high concentration (500 mg/ml) dispersed in either ethanol or isopropanol are embedded in PEDOT:PSS. Planar Si(100) substrates are used for solar cell device fabrication.
3:List of Experimental Equipment and Materials:
PEDOT:PSS (PH1000), AgNWs, ethylene glycol (EG), methanol (MeOH), fluorosurfactant (FS-300), SEM (Zeiss Merlin), TEM (Zeiss Libra 200 MC), four-point probe method (Ecopia HMS-5300), UV-Vis spectrophotometer (Perkin-Elmer Lambda 1050), XPS (Thermo-VG Scientific ESCALab 250), AFM/EFM (Asylum Research Cypher microscope).
4:Experimental Procedures and Operational Workflow:
AgNWs are pre-mixed with mixed co-solvent before adding to PEDOT:PSS. Films are deposited by spin-coating. EFM measurements are performed to study charge transfer.
5:Data Analysis Methods:
Sheet resistance is measured using the four-point probe method. Reflectance and transmittance spectra are obtained. XPS is used for chemical-state composition analysis. EFM phase images are analyzed for charge transfer characteristics.
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UV-Vis spectrophotometer
Perkin-Elmer Lambda 1050
Perkin-Elmer
Obtaining reflectance spectra of the films
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XPS
Thermo-VG Scientific ESCALab 250
Thermo-VG Scientific
Chemical-state composition analysis
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SEM
Zeiss Merlin
Zeiss
Examining AgNWs and film surface morphologies
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TEM
Zeiss Libra 200 MC
Zeiss
Examining AgNWs and film surface morphologies
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PEDOT:PSS
PH1000
Conducting polymer used in hybrid solar cells
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AgNWs
Enhancing conductivity and charge transfer in PEDOT:PSS
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Four-point probe
Ecopia HMS-5300
Ecopia
Measuring sheet resistances
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AFM/EFM
Asylum Research Cypher
Asylum Research
AFM or EFM measurements
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