研究目的
Investigating the effect of solvent additives on the morphology and device performance of printed non-fullerene acceptor based organic solar cells.
研究成果
The addition of 0.25 vol% DIO significantly improves the PCE of printed organic solar cells by optimizing the morphology and optical properties. Higher concentrations of DIO have less pronounced positive effects due to charge trapping and increased rotational disorder of crystallites.
研究不足
The study is limited to the specific materials PBDB-T-SF and IT-4F and the solvent additive DIO. The findings may not be directly applicable to other material systems or solvent additives.
1:Experimental Design and Method Selection:
Active layers of the conjugated polymer PBDB-T-SF and the non-fullerene small molecule acceptor IT-4F were printed using meniscus guided slot-die coating with varying concentrations of 1,8-diiodoctane (DIO). The effect on the inner nano-structure and surface morphology was studied using GISAXS, GIWAXS, SEM, and AFM. Optical properties were studied with PL, UV/Vis absorption spectroscopy, and EQE measurements.
2:Sample Selection and Data Sources:
The materials were dissolved in chlorobenzene with different DIO concentrations.
3:List of Experimental Equipment and Materials:
Slot-die coater, GISAXS, GIWAXS, SEM, AFM, PL spectrometer, UV/Vis spectrometer, EQE measurement kit.
4:Experimental Procedures and Operational Workflow:
Printing of active layers, characterization of morphology and optical properties, measurement of device performance.
5:Data Analysis Methods:
Modeling of GISAXS data with EIA of DWBA, analysis of GIWAXS data, fitting of Gaussian functions to PL and UV/Vis data.
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PL spectrometer
LS 55
Perkin Elmer
Measurement of photoluminescence
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UV/Vis spectrometer
Lambda 650S
Perkin Elmer
Measurement of absorbance spectra
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Slot-die coater
Printing of active layers for organic solar cells
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GISAXS
Analysis of inner nano-structure of bulk-heterojunction organic solar cells
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GIWAXS
Analysis of crystalline part of thin films
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SEM
Imaging the structure at the sample surface
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AFM
Imaging the structure at the sample surface
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EQE measurement kit
QE-PV-SI
Newport
Measurement of external quantum efficiency
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