研究目的
The purpose of this work is the demonstration of LIBT using ps pulses with laser fluences in the order of 100 mJ/cm2, considerably below the ablation threshold of thin Au films, for the controllable transfer of ultra-thin Au microdisks, which retain the pristine shape and thickness of the metal thin film (down to 5 nm).
研究成果
LIBT has been successfully employed for transferring ultra-thin Au films (down to 5 nm) with retained form factors, using low laser fluence values. The use of highly reflective substrates like Si facilitates the transfer under low laser fluence, making the process suitable for applications involving ultra-thin materials on flexible substrates.
研究不足
The study focuses on ultra-thin gold films and PDMS substrates, limiting the generalizability to other materials and substrates. The process requires precise control of laser fluence and substrate properties.
1:Experimental Design and Method Selection
The study employs Laser-Induced Backward Transfer (LIBT) technique for transferring ultra-thin gold films on Polydimethylosiloxane (PDMS) substrate using ps pulses and low laser fluences.
2:Sample Selection and Data Sources
Ultra-thin gold films (60, 10, and 5 nm thick) deposited on silicon and glass substrates via electron beam evaporation were used as donor materials. PDMS films were used as receiver substrates.
3:List of Experimental Equipment and Materials
A diode pumped solid state (DPSS) laser source operating at 532 nm with 8 ps pulse width, a 30 mm plano-convex lens for focusing, and a translation stage for controlling the focusing distance. Materials include Au films, PDMS, silicon wafers, and glass cover slips.
4:Experimental Procedures and Operational Workflow
Single laser pulses were focused at the Au/PDMS interface. The donor/receiver holder was mounted on a translation stage to control the focusing distance. The LIBT process involved the laser pulse passing through the receiver substrate and focusing at the Au/substrate interface.
5:Data Analysis Methods
Structures were characterized using optical microscopy, scanning electron microscopy (SEM), and atomic force microscopy (AFM). A custom Matlab script was used for nanoparticle density analysis.
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