研究目的
To address the toxicity and instability issues of lead halide perovskites by fabricating high-quality Cs2AgBiCl6 double perovskite thin films for ultraviolet photodetectors.
研究成果
The study successfully demonstrated the fabrication of high-quality Cs2AgBiCl6 double perovskite thin films via sequential vapor deposition, leading to high-performance UV photodetectors with excellent selectivity, low dark current, high photoresponsivity, and detectivity. The findings pave the way for the application of double perovskites in optoelectronic devices, offering a solution to the toxicity and instability issues of lead halide perovskites.
研究不足
The study focuses on the fabrication and characterization of Cs2AgBiCl6 double perovskite thin films and their application in UV photodetectors. The scalability of the sequential vapor deposition method and the performance of the photodetectors under varying environmental conditions beyond the tested parameters are potential areas for further optimization.
1：Experimental Design and Method Selection:
Sequential vapor deposition was used to fabricate Cs2AgBiCl6 perovskite films. The method involved depositing CsCl, BiCl3, and AgCl layer by layer in a vacuum environment under pressure below 1.0 × 10?3 Pa, followed by annealing in nitrogen environment.
2：0 × 10?3 Pa, followed by annealing in nitrogen environment.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: The films were deposited on fluorine doped tin oxide (FTO) substrates. The stoichiometry and crystallinity were confirmed through X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) measurements.
3：List of Experimental Equipment and Materials:
Materials included BiCl3, CsCl, AgCl, PTAA, Spiro-OMeTAD, P3HT, TFB, Li-TFSI, tBP, 1,2-dichlorobenzene, and SnO2 colloidal solution. Equipment included a Bruker D8 Advance diffractometer, Hitachi S-4300 field-emission electron microscope, Carry 500 UV-vis spectrometer, FluoTime 300 for PL measurements, Thermo Fisher Scientific Escalab 250Xi system for UPS and XPS, QE-R for EQE measurements, and Keithley 4200 series digital source-meter unit for J-V curves.
4：Experimental Procedures and Operational Workflow:
The films were annealed at different temperatures to optimize crystallinity and morphology. The device configuration of FTO/ETL/perovskite/HTL/Au was employed for UV photodetectors.
5：Data Analysis Methods:
The spectral photoresponsivity and detectivity were derived from EQE measurements and dark current density, respectively.
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