研究目的
Investigating the fast transformation of Rare-earth doped luminescent sub-microcrystal via plasmonic nanoislands.
研究成果
The study demonstrates a fast and efficient method for transforming polycrystalline NaYF4 to single crystal Y2O3 using plasmonic nanoislands. This method overcomes the limitations of traditional annealing treatments by enabling rapid transformation at low temperatures and in air. The transformation rate can be controlled by laser parameters and the properties of the nanoislands.
研究不足
The study focuses on the transformation of NaYF4 to Y2O3 and may not be directly applicable to other materials without further research. The stability of Ag nanoislands in air is limited due to oxidation.
1:Experimental Design and Method Selection:
The study employs plasmonic gold/silver nanoislands to achieve a fast transformation of RE3+ doped sub-microcrystals. The transformation is monitored through luminescence spectra.
2:Sample Selection and Data Sources:
Polycrystalline NaYF4:Eu3+ is synthesized via a wet-chemical method. Gold/silver nanoislands films are prepared by evaporating gold/silver onto substrates followed by annealing.
3:List of Experimental Equipment and Materials:
FEI-Nova NanoSEM 450, Bruker-JPK NanoWizard Ultras, Rigaku D/Max2550VB+/PC diffractometer, Perkin Elmer Lambda 950 spectrometer, FEI Helios G4 CX, FEI Titan cubed Themis G2 300 microscope, LabRam HR Evolution Raman system.
4:Experimental Procedures and Operational Workflow:
Polycrystalline NaYF4 particles are deposited on Au/Ag nanoislands films. The transformation is induced by laser irradiation, and the process is monitored in-situ via luminescence spectra.
5:Data Analysis Methods:
The structural properties of the transformed product are characterized using TEM-EDX, SAED, and HAADF. The dynamic process of crystal transformation is investigated by controlling the irradiation time.
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FEI-Nova NanoSEM 450
NanoSEM 450
FEI
Scanning electron microscope for characterizing sample morphologies
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Bruker-JPK NanoWizard Ultras
NanoWizard Ultras
Bruker-JPK
Atomic force microscope for obtaining AFM images
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Rigaku D/Max2550VB+/PC diffractometer
D/Max2550VB+/PC
Rigaku
X-ray diffraction for structural analysis
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Perkin Elmer Lambda 950 spectrometer
Lambda 950
Perkin Elmer
Extinction spectra acquisition
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FEI Helios G4 CX
Helios G4 CX
FEI
Focused ion beam for cutting nanoscale thin foil
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FEI Titan cubed Themis G2 300
Titan cubed Themis G2 300
FEI
Transmission electron microscope for structural information verification
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LabRam HR Evolution Raman system
HR Evolution
LabRam
In-situ laser spectra measurements
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