研究目的
To develop a novel and simple synthesis of the absorber layer for quantum solar cells to reduce cost and processing, focusing on Cu2CoSnS4-carbon quantum dot (CCTS:CQD) nano-composite as an absorbing material.
研究成果
The study successfully developed a novel CCTS:CQD nano-composite with good photo-response, suitable for thin film solar cells. The composite showed polycrystalline nature and dynamic photoluminescence dependent on excitation wavelength.
研究不足
The study focuses on the synthesis and preliminary characterization of CCTS:CQD nano-composites. Further optimization and device integration studies are needed for practical applications.
1:Experimental Design and Method Selection
Direct pyrolysis method was used for the preparation of CCTS:CQD nano-composites. The properties were studied using UV-Vis spectrophotometer, X-ray diffraction, and high-resolution transmission electron microscope (HRTEM). Thin films were deposited by spray pyrolysis technique.
2:Sample Selection and Data Sources
Precursors included CuCl2.2H2O, CoCl2.6H2O, SnCl4.5H2O, thiourea, and citric acid. Proportions of citric acid to CCTS were varied from 0.1 to 0.7.
3:List of Experimental Equipment and Materials
UV-Vis-NIR spectrophotometer, X-ray diffractometer, HRTEM, spray pyrolysis setup, and other characterization tools were used.
4:Experimental Procedures and Operational Workflow
The synthesis involved mixing precursors, pyrolysis at 180 °C, and deposition of thin films by spray pyrolysis at 170 °C. Characterization included structural, optical, and photoluminescence studies.
5:Data Analysis Methods
Optical properties were analyzed using UV-Vis spectra, structural properties by XRD and HRTEM, and photoconductivity by I-V measurements.
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Keithly source meter
2450
Keithley
Measuring I-V characteristics
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UV-Vis-NIR spectrophotometer
UV-Vis-1800
Shimadzu
Recording optical transmittance over a wavelength range of 300-900 nm
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X-ray diffractometer
X’pert PRO
PANalytical
Recording XRD patterns using CuKα radiation
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High-resolution transmission electron microscope
JEM 2100
JEOL
Performing TEM measurements
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Confocal Raman spectrometer
Carrying out Raman analysis
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Fourier Transform Infrared spectroscopy
IR Affinity 1S series
Identifying functional groups
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Surface profilometer
KLA-Tencor
Measuring the thickness of the film
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Hall measurement system
HMS-3000
Ecopia
Carrying out Hall measurements by four probe methods
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