研究目的
Investigating the application of TiO2–ZnO binary mixed nanoparticles as electron transport layers in low-temperature processed perovskite solar cells to improve their efficiency and stability.
研究成果
The TiO2–ZnO binary mixed NP ETL improves the interfacial stability and prevents the decomposition of the perovskite layer, leading to an improved efficiency of 15%. This method provides a simple way for the application of ZnO in perovskite solar cells.
研究不足
The study focuses on low-temperature processed perovskite solar cells, which may limit the applicability of the findings to high-temperature processes. The efficiency improvement, while significant, may still be below commercial standards.
1：Experimental Design and Method Selection:
The study proposed a TiO2–ZnO binary mixed nanoparticle ETL prepared via a low-temperature hydrothermal method.
2：Sample Selection and Data Sources:
ZnO and TiO2 nanoparticles were synthesized and mixed to form the ETL. Perovskite layers were grown on these ETLs.
3：List of Experimental Equipment and Materials:
SEM, AFM, XRD, DLS, EDS, UV spectrum, EIS, and Keithley 2611 source meter were used. Materials included methamidine iodide, lead bromide, cesium iodide, Spiro-MeOTAD, etc.
4：Experimental Procedures and Operational Workflow:
ETLs were fabricated by spin-coating precursor liquid, followed by annealing. Perovskite layers were grown using a two-step process.
5：Data Analysis Methods:
XRD and SEM were used to analyze crystallinity and morphology. UV spectrum and EIS were used to study optical and electrical properties.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
Electrochemical impedance spectroscopy
Versa STAT 4
AME-TEK
To characterize the carrier transmission performance of solar cell devices.
-
Scanning electron microscope
JSM-7800
JEOL
To record the surface morphology of perovskite films.
-
Atomic force microscope
Bruker Dimension Icon
Bruker
To record the surface morphology of perovskite films.
-
Keithley 2611 source meter
2611
Keithley
To measure the current density–voltage (J–V) curves of the PSCs.
-
X-ray diffraction
To measure the crystallization of thin films.
-
Dynamic light scattering
Nano-ZS
To characterize the dispersity of TiO2 and ZnO NPs.
-
Energy Dispersive Spectrometer
To analyze the elemental component of thin films.
-
登录查看剩余5件设备及参数对照表
查看全部
