研究目的
Investigating the enhancement of charge separation and photo-electrochemical stability of CuBi2O4 photoelectrodes through a novel fabrication method combining pulsed laser deposition (PLD) and rapid thermal processing (RTP).
研究成果
The PLD/RTP fabrication approach offers new possibilities of fabricating complex metal oxides photoelectrodes with a high degree of crystallinity and good electronic properties at higher temperatures than the thermal stability of glass-based transparent conductive substrates would allow. The phase-pure CuBi2O4 photoelectrodes made by combined PLD and RTP demonstrate superior electronic properties and unprecedented photo-electrochemical stability without protection layers and catalysts.
研究不足
The low photocurrents of the CuBi2O4 photocathodes fabricated through PLD/RTP are primarily attributed to their low specific surface area, lack of CuO impurities, and limited, slow charge transport in the undoped films.
1：Experimental Design and Method Selection:
The study employed pulsed laser deposition (PLD) to sequentially deposit Bi2O3 and CuO layers on fluorine-doped tin oxide (FTO) substrates, followed by rapid thermal processing (RTP) to achieve phase-pure CuBi2O4 films.
2：Sample Selection and Data Sources:
Films were deposited on FTO-coated glass or quartz substrates, cleaned in specific solutions before deposition.
3：List of Experimental Equipment and Materials:
A PLD system (PREVAC, Poland) with a KrF-Excimer laser (248 nm, LPXPro 210, COHERENT) was used for deposition. A Rapid Thermal Processor (model: AS-One 100, ANNEALSYS) was used for RTP.
4：Experimental Procedures and Operational Workflow:
Films were deposited at a substrate temperature of 500 °C, with a laser fluence of
5：5 J cm?2 and a repetition rate of 10 Hz. RTP treatments were performed under atmospheric pressure of pure oxygen, with a heating rate of 10 K s?Data Analysis Methods:
X-ray diffraction, Raman microscopy, UV–vis measurements, scanning electron microscopy, energy-dispersive X-ray analysis, and photo-electrochemical measurements were conducted to characterize the films.
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