研究目的
To explore the influences of oxygen concentrations on the properties of sputtered MoOx films and their application as back contact in CdTe solar cells.
研究成果
The study demonstrated that sputtered MoOx films with different oxygen content can be used as back contact buffers in CdTe solar cells. The performance of the cells was affected by the oxidation of CdTe surface, the large valence band offset, and the insufficient work function. Optimizing the back contacts improved the efficiency to 11.8%.
研究不足
The work function of sputtered MoOx film is not high enough to induce the energy band of CdTe to bend upward, and the formation of TeO2 at the MoOx/CdTe interface can deteriorate device performance.
1:Experimental Design and Method Selection:
MoOx films were prepared by reactive RF magnetron sputtering technique at different oxygen concentrations. The films were characterized for their composition stoichiometry, defect states, work functions, electrical and optical properties.
2:Sample Selection and Data Sources:
The films were deposited on soda-lime glass substrates at room temperature.
3:List of Experimental Equipment and Materials:
XPS (Axis Supra of Kratos, UK), Kelvin probe force microscopy (KPFM, Multimode 8, Bruker), Hitachi S-5200 for SEM, four probe method (RTS-8) for sheet resistance and resistivity, UV–Vis–NIR grating spectrophotometer (PerkinElmer Lambda 950) for optical transmission spectra.
4:Experimental Procedures and Operational Workflow:
The chamber was evacuated, and films were deposited at different oxygen flow rates. The films were then characterized using the mentioned equipment.
5:Data Analysis Methods:
XPS data was used to analyze core level binding energies spectra, oxidation states, and composition stoichiometry. KPFM was used to measure work functions.
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