研究目的
To develop ferroelectric photovoltaic devices with high power conversion efficiency by introducing Fe3+ into Pb0·93La0·07(Zr0·6Ti0.4)0.9825O3 ferroelectric thin film to increase the remnant polarization and decrease the band gap.
研究成果
The study demonstrates that Fe3+ doping in PLZT thin films can simultaneously increase the remnant polarization and reduce the band gap, leading to superior photovoltaic properties. The optimal Fe3+ doping amount is found to be 4.8 mol%, achieving a high open-circuit voltage and short-circuit current. This approach provides a novel pathway for designing high-efficiency ferroelectric photovoltaic devices.
研究不足
The study is limited to the effects of Fe3+ doping on the photovoltaic properties of PLZT thin films. The potential for optimization in terms of other dopants or fabrication techniques is not explored.
1:Experimental Design and Method Selection:
The study involves the preparation of Fe3+ doping Pb0·93La0·07(Zr0·6Ti0.4)0.9825O3 thin films using a sol-gel method and spin-coating technique. The influence of Fe3+ contents on the band gap and remnant polarization of the thin films and the photovoltaic performance of the devices is studied.
2:4)9825O3 thin films using a sol-gel method and spin-coating technique. The influence of Fe3+ contents on the band gap and remnant polarization of the thin films and the photovoltaic performance of the devices is studied.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: The samples are prepared with varying Fe3+ doping amounts (x = 0, 1.6, 4.0, 4.8, 5.6, and 7.2 mol%).
3:6, 0, 8, 6, and 2 mol%).
List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: X-ray diffraction (XRD, D8 Advance, Bruker, Germany), ferroelectric tester (Precision LC II, Radiant Technologies Inc., USA), high-voltage amplifier (Trek 609B; Trek, USA), UV–Vis–NIR spectrophotometer (UV-3600 Plus, Shimadzu, Japan), Keithley 2635 source meter, solar simulator (Gloria-X500A, Zolix, China).
4:Experimental Procedures and Operational Workflow:
The thin films are grown on FTO substrates, annealed, and characterized for their crystal structure, optical, and ferroelectric properties. Photovoltaic devices are fabricated and their performance is evaluated under simulated AM 1.5G irradiation.
5:5G irradiation.
Data Analysis Methods:
5. Data Analysis Methods: The optical band gap is calculated using Tauc's Law, and the photovoltaic performance is analyzed based on the J-V curves.
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