研究目的
To characterize the depth profile of the lattice parameters of the CIGS absorbing layer and to investigate the bandgap grading of the CIGS absorbing layer using a glancing incidence X-ray diffraction (GIXRD) technique.
研究成果
The study successfully characterized the depth profile of the lattice parameters of the CIGS absorbing layer using the GIXRD technique. The results showed that the lattice parameters and the bandgap of the absorbing layer are graded with depth, which is consistent with the compositional gradient of In or Ga. This approach provides a nondestructive method to estimate the bandgap depth profile and understand the material's electronic properties.
研究不足
The study assumes that the changes in the lattice parameters or unit-cell volume follow Vegard’s law, which may not account for all possible variations in the material's properties. Additionally, the technique's resolution is limited by the X-ray penetration depth and the sensitivity of the diffraction method.
1：Experimental Design and Method Selection:
The study employed the GIXRD technique to characterize the depth profile of the lattice parameters of the CIGS absorbing layer. The methodology involved adjusting the incident angle of X-rays to control the penetration depth and analyze the lattice parameters as a function of depth.
2：Sample Selection and Data Sources:
The CIGS thin-film solar cells were deposited on Mo-coated stainless steel substrates. The absorbing layer was grown by co-evaporation of Cu, In, Ga, and Se at 400°C.
3：List of Experimental Equipment and Materials:
Equipment used included a transmission electron microscope (TEM, JEM-2100F: JEOL, Japan) for structural analysis and a smartLAB diffractometer (Rigaku, Japan) for GIXRD measurements.
4：Experimental Procedures and Operational Workflow:
The GIXRD data were collected from the diffraction angle range of 10° to 90° at a step of 0.02° (2θ) using CuKα1 wavelength. The incident angle was varied from 0.50° to 5.00° to control the penetration depth.
5：02° (2θ) using CuKα1 wavelength. The incident angle was varied from 50° to 00° to control the penetration depth.
Data Analysis Methods:
5. Data Analysis Methods: The Pawley refinement method was used to refine the lattice parameters based on the GIXRD data. The refinement process involved correcting the zero-point shift and refining peak-profile function parameters.
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